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Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Buch | Hardcover
280 Seiten
2012
Academic Press Inc (Verlag)
978-0-12-394396-5 (ISBN)
CHF 296,75 inkl. MwSt
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Merges two serials - Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This title features articles on the physics of electron devices, particle optics at high and low energies, microlithography, image science and digital image processing, and electromagnetic wave propagation.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Precession Electron DiffractionA. S. Eggeman and P. A. Midgley
Scanning Helium Ion MicroscopyR. Hill, J. A. Notte, and L. Scipioni
Signal reconstruction algorithm based on a single intensity in the Fresnel domainHone-Ene Hwang, Pin Han
Electron Microscopy Studies on Magnetic L10 FePd NanoparticlesKazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu
Fundamental aspects of Near Field Emission Scanning Electron MicroscopyD. A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J. P. Xanthakis

Reihe/Serie Advances in Imaging and Electron Physics
Mitarbeit Herausgeber (Serie): Peter W. Hawkes
Verlagsort San Diego
Sprache englisch
Maße 152 x 229 mm
Gewicht 520 g
Themenwelt Informatik Grafik / Design Digitale Bildverarbeitung
Naturwissenschaften Physik / Astronomie Angewandte Physik
Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Technik
ISBN-10 0-12-394396-5 / 0123943965
ISBN-13 978-0-12-394396-5 / 9780123943965
Zustand Neuware
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