Handbook of Optical Constants of Solids (eBook)

Edward D. Palik (Autor)

eBook Download: EPUB

1998 | 1. Auflage
999 Seiten
Elsevier Science (Verlag)
978-0-08-053378-0 (ISBN)

Infos

This is the third volume of the very successful set. This updated volume will contain non-linear properties of some of the most useful materials as well as chapters on optical measurement techniques.


* Contributors have decided the best values for n and k
* References in each critique allow the reader to go back to the original data to examine and understand where the values have come from
* Allows the reader to determine if any data in a spectral region needs to be filled in
* Gives a wide and detailed view of experimental techniques for measuring the optical constants n and k
* Incorporates and describes crystal structure, space-group symmetry, unit-cell dimensions, number of optic and acoustic modes, frequencies of optic modes, the irreducible representation, band gap, plasma frequency, and static dielectric constant

Inhalt

Cover 1
Contents 6
List of Contributors 14
Preface 18
PART l: DETERMINATION OF OPTICAL CONSTANTS 20
Chapter 1. Introductory Remarks 22
I. Introduction 22
II. The Chapters 23
III. The Critiques 24
IV. The Tables 24
V. The Figures of the Tables 24
VI. Corrections, Additions, and Comments 25
References 31
Chapter 2. Determination of the Far-Infrared Optical Constants of Solids by Dispersive Fourier Transform Spectroscopy 32
I. Introduction 32
II. The Materials 39
Acknowledgment 74
References 74
Chapter 3. Photothermal/Photoacoustic Spectroscopic Measurements of Optical Absorption Coefficients in Semiconductors 78
I. Introduction 78
II. Photoacoustic Spectroscopy (PAS) 79
III. Photopyroelectric Spectroscopy (PPES) 86
IV. Measurements of a(. 
88 
Acknowledgments 113
References 113
Chapter 4. Photothermal Deflection Measurements of the Extinction Coefficient k 118
I. Introduction 118
II. Photothermal Deflection 122
III. Conclusions 135
Acknowledgments 136
References 136
Chapter 5. Determination of Optical Constants by Brillouin Scattering 140
I. Definition of Notation 140
II. Introduction 141
III. Background on Brillouin Scattering Technique 142
IV. Equations for Measurement of the Index of Refraction 144
V. Fabry-Perot Interferometers 147
VI. Discussion 148
VII. Brillouin Scattering in Thin Slabs and Optical Fibers 153
VIII. Special Case of Transparent Thin Slabs 154
IX. Brillouin Scattering in Optical Fibers 165
References 172
Chapter 6. Doped n-Type Silicon (n-Si) 174
I. Introduction 174
II. Contributions to Dielectric Function: Optical Properties versus Optical Constants 175
III. Semiclassical Theory of Free-Carrier Contribution to the Dielectric Function: The Drude Approximation 177
IV. Free-Carrier Contribution to the Dielectric Function in Quantum Absorption Regime: Generalized Drude Approach 178
V. Experimental Data Overview 181
VI. Generalized Drude Approximation for n-Si 185
VII. Tabulation of Optical Constants of Doped n-Si 190
References 204
Chapter 7. Optical Parameters for the Materials in HOC I, HOC II, and HOC III 206
I. Introduction 206
II. The Parameters 206
References 244
PART II: CRITIQUES 248
Subpart 1. Metals 250
Introduction to the Data for Several Metals 252
I. Introduction 252
References 254
II. Magnesium (Mg) 254
References 254
III. Titanium (Ti) 259
References 260
IV. Manganese (Mn) 268
References 269
V. Ruthenium (Ru) 272
References 273
VI. Indium (In) 280
References 281
VII. Tin (Sn) 287
References 288
VIII. Antimony (Sb) 293
References 294
IX. Rhenium (Re) 297
References 298
Optical Constants of Eight Rare-Earth Elements 306
I. Introduction 306
II. Cerium (Ce) 311
III. Samarium (Sm) 312
IV. Gadolinium (Gd) 313
V. Terbium (Tm) 316
VI. Dysprosium (Dy) 317
VII. Erbium (Er) 319
VIII. Thulium (Tm) 320
IX. Ytterbium (Yb) 321
References 322
Cesium (Cs) 360
References 363
Zirconium Nitride (ZrN), Hafnium Nitride (HfN) 370
References 377
Subpart 2. Semiconductors 390
Aluminum Nitride (AIN) 392
References 396
Bismuth Silicon Oxide (Bi12Si020) and Bismuth Germanium Oxide (Bi12GeO20) 422
References 427
Boron Nitride (BN) 444
References 448
Cadmium Germanium Arsenide (CdGeAs2) 464
References 467
Copper Gallium Sulfide (CuGaS2) 478
References 481
Gallium Selenide (GaSe) 492
References 496
Gallium Telluride (GaTe) 508
References 510
Iron Pyrite (FeS2) 526
References 530
Silicon (Si) Revisited (1.1-1.3 eV) 538
References 543
Silicon (Si) Revisited (1.4-6.0 eV) 550
References 552
Silicon-Germanium Alloys (SixGe1-x) Revisited 556
References 557
Silver Chloride (AgCI), Silver Bromide (AgBr), Silver Iodide (Agl) 572
References 575
Silver Gallium Selenide (AgGaSe2) and Silver Gallium Sulfide (AgGaS2) 592
References 596
Zinc Arsenide (Zn3As2) 614
References 615
Zinc Phosphide (Zn3P2) 628
References 631
Zinc Germanium Phosphide (ZnGeP2) 656
References 659
Subpart 3. Insulators 670
Aluminum Oxide (A12O3) Revisited 672
References 676
Barium Fluoride (BaF2) 702
References 705
Calcium Carbonate, Calcite (CaCo3) 720
References 722
Cesium Bromide (CsBr) 736
References 738
Cesium Chloride (CsCI) 750
References 752
Cesium Fluoride (CsF) 762
References 764
Beta-Gallium Oxide (ß -Ga203) 772
References 774
Lead Fluoride (PbF2) 780
References 785
Lithium Tantalate (LiTaO3) 796
References 799
Potassium Iodide (KI) 826
References 829
Potassium Niobate (KNbO3) 840
References 844
Rubidium Bromide (RbBr) 864
References 867
Rubidium Iodide (Rbl) 876
References 880
Sodium Nitrate (NaNO3) 890
References 892
Strontium Fluoride (SrF2) 902
References 905
Orthorhombie Sulfur (a-S) 918
References 924
Cubic Thallium(I) Halides 942
References 950
Yttrium Aluminum Garnet (Y3AI5O12) 982
References 985
Zircon (ZrSiO4) 1006
References 1008

Textauszug

Chapter 1

Introductory Remarks

Edward D. Palik    Institute for Physical Science and Technology University of Maryland College Park, Maryland

I. Introduction   3

II. The Chapters   4

III. The Critiques   5

IV. The Tables   5

V. The Figures of the Tables   5

VI. Corrections, Additions, and Comments   6

A. Optical Constants of CdS   6

B. Optical Constants of Metal Films   6

C. Henke Model for the Elements   8

D. More-Recent Papers about Optical Constants   9

E. Optical Constants on Disk   12

References   12

I INTRODUCTION

The two previous volumes of Handbook of Optical Constants of Solids (HOC I and HOC II) contained about 85 materials. The present volume adds about 58 more materials, roughly divided into equal numbers of metals, semiconductors, and insulators. A long list of potential materials was circulated among possible critiquers. They chose and/or recommended the ones presented here. There are still some materials omitted because of a lack of critiquers. These include Bi, B, Ba, Ca, Cd, Pb, Zn, Zr, ZnO, HgS, HgSe, PbxSn1–xSe, PbO, MoS2, Cd3As2, GaS, LiOH, NaBr, Nal, KF, LiCl, LiBr, ZrO2, BaO, and NiO. Note that 43 of the 92 chemical elements are done and 143 of the 100,000 (or more) chemical compounds. We have omitted glasses generally, which are covered to some extent by Efimov [1] and Tropf et al. [2].

There is some loose use of the words semiconductor and insulator in HOC I and HOC II based primarily on the band gap being less or greater than 3 eV. AgCl, AgBr, Agl, BSO, and BGO are considered as semiconductors because their electrical properties can be controlled by doping during growth of the crystals, but they may end up in either category. Diamond is invariably thought of as an insulator, although natural diamonds can be found with semiconducting properties.

II THE CHAPTERS

The chapters are meant to describe experimental techniques for measuring n and k.

In Chapter 2, Parker et al. discuss the determination of n and k by differential Fourier transform spectroscopy in the far infrared. This is an elegant way to obtain n and k from the reflection amplitude and phase and has been applied to many semiconductors and insulators. It is of interest to compare these newer optical constants with those in HOC I or HOC II, which have generally been obtained by Kramers-Kronig (K-K) analysis or classical oscillator fit.

In Chapter 3, Mandelis describes the use of photoacoustic spectroscopy to determine k. While this chapter stresses semiconductors, several variations of the technique have also found widespread use for other materials.

In Chapter 4, Briggs discusses photothermal deflection as a method of determining k. It is done with two intense beams, one to heat up a small spot on a sample and a second to detect bending of the sample as it expands locally.

In Chapter 5, Boukari and Lagakos describe the determination of n and k by Brillouin scattering. While not usually thought of as a technique for determining optical constants, there are novel ways to determine n an k in highly absorbing materials and n in transparent slabs and thin films.

In Chapter 6, Auslender and Hava develop models for calculating n and k in n-Si for the infrared region for free-electron concentrations from 1016 to 1020 cm−3.

In Chapter 7, Palik collects a number of optical parameters for all the materials in HOC I, HOC II, and HOC III including crystal structure, space group symmetry, unit cell dimensions, number of molecules/unit cell, optic and acoustic irreducible representation, transverse and longitudinal lattice vibration frequencies, plasma frequency, band gap, and d.c. dielectric constant.

There were suggestions for chapters on the loss-tangent method at low frequencies and on the prism minimum-deviation technique (still the best way to determine n), but these could not be done at this time.

III THE CRITIQUES

The critiques are meant to be the critiquer's own judgment of the best room-temperature values of n and k over the widest spectral range. As the volumes have progressed, we have expanded the range a little with a few critiques including above and below room-temperature data. Sometimes there are two overlapping sets of data from two different laboratories which can be compared. This sometimes happens in the far infrared where reflectivity is K-K analyzed and/or a classical oscillator model is applied. Generally, it is not a good idea to give the reader a choice of data—it is the job of the critiquer to make the choice. Sometimes, however, a comparison sheds light on the problems arising in the measurement of optical constants such as wavelength calibration and determination of absolute reflectivity. Recently, spectroscopic ellipsometry has grown into a wide-spread technique for the 1.5–6 eV region, probably supplanting K-K analysis of reflectivity.

We have returned to a few materials done in previous volumes because more data have become available. Therefore, we revisit Al2O3, SixGe1−x and Si.

IV THE TABLES

The tables of n and k have become more individual to meet the needs of the individual critiquers. We maintain the columns labeled eV, cm−1, µm, n, k and proceed down the column in decreasing eV. Reference brackets [1] start at the top of a given data column and are understood down the column until a new data set occurs, which is then labeled [2], for example. We promoted exponential notation especially of k, ideally for every column, but have not yet reached that stage of uniformity.

To facilitate editing the tables for the Optical Society of America, we have requested that the exponential notation be used at every row, rather than omitting the exponent until it changes value somewhere down the column.

V THE FIGURES OF THE TABLES V

The critiquers have taken more leeway with the figures, since they had to produce them with whatever graphics software they had available. In previous editions, all the figures were prepared by the same artist who kept the style uniform. Now critiquers can use data points (usually for n and for k). Data points can be connected with lines, or just lines can be used (usu-ally — for n and — for k). In the past, both n and k were plotted on the same figure with the same log-log scale. Since the extent of k determined the number of decades of the log scale for the ordinate, (10−7 < k < 101), n was squeezed. Also, for solids with a lot of vibration bands, this region got very busy. Now some critiquers have separated n and k plots to show the structure more clearly.

The drawbacks in having each critiquer make his own figure are the many problems of font size, tick-mark position, and border thickness, remembering that the figure will be reduced in published form.

VI CORRECTIONS, ADDITIONS, AND COMMENTS

A Optical Constants of CdS

A correction and addition to the data for CdS from HOC II needs to be made according to the critiquer, L. Ward. Data of Dutton1 near the band edge has been added. The extinction coefficient for both Ec and E⊥c has been determined by transmission measurements of thin slabs of different thicknesses. These can be compared to data of Cardona and Harbeke2 for bulk-oriented samples obtained from K-K analysis of reflectivity with polarized light. Data of Khawaja and Tomlin3 for films deposited on quartz substrates (assumed to be polycrystal-line) were obtained from transmittance and reflectance measurements; these data have been reassessed to correct an error in reading the wavelength scale. The results are presented in Table I. While above the band gap the results for k are comparable, below the band gap where absorption decreases orders of magnitude, the results differ drastically among the three data sets. We suspect that K-K analysis of reflectivity in Cardona and Harbeke gives poor results for k « 1 compared to transmittance of slabs in Dutton. For the polycrystalline films in Khawaja and Tomlin, it is not obvious why k is so much larger compared to the data of Dutton below the band gap. Perhaps there was significant light scattering from defected...

Produkt-Details

• Erscheint lt. Verlag: 18.3.1998
• Sprache: englisch
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Optik
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Themenwelt: Technik ► Maschinenbau
• ISBN-10: 0-08-053378-7 / 0080533787
• ISBN-13: 978-0-08-053378-0 / 9780080533780