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Data Modeling for Metrology and Testing in Measurement Science (eBook)

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2008 | 2009
XVIII, 486 Seiten
Birkhäuser Boston (Verlag)
978-0-8176-4804-6 (ISBN)

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This book provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods and focusing on techniques with a broad range of real-world applications.

The book will be useful as a textbook for graduate students, or as a training manual in the fields of calibration and testing. The work may also serve as a reference for metrologists, mathematicians, statisticians, software engineers, chemists, and other practitioners with a general interest in measurement science.


The aim of this book is to provide, ?rstly, an introduction to probability and statistics especially directed to the metrology and testing ?elds and secondly, a comprehensive, newer set of modelling methods for data and uncertainty analysis that are generally not considered yet within mainstream methods. The book brings, for the ?rst time, a coherent account of these newer me- ods and their computational implementation. They are potentially important because they address problems in application ?elds where the usual hypot- ses that are at the basis of most of the traditional statistical and probabilistic methods, for example, relating to normality of the probability distributions, are frequently not ful?lled to such an extent that an accurate treatment of the calibration or test data using standard approaches is not possible. Additi- ally, the methods can represent alternative ways of data analysis, allowing a deeper understanding of complex situations in measurement. The book lends itself as a possible textbook for undergraduate or postgraduate study in an area where existing texts focus mainly on the most common and well-known methods that do not encompass modern approaches to calibration and testing problems. The book is structured in such a way to guide readers with only a g- eral interest in measurement issues through a series of review papers, from an initial introduction to modelling principles in metrology and testing, to the basic principles of probability in metrology and statistical approaches to - certainty assessment.

Preface
List of Contributors
An Introduction to Data Modelling Principles in Metrology and Testing / Franco Pavese
Probability in Metrology / Giovanni B. Rossi
Three Statistical Paradigms for the Assessment and Interpretation of Measurement Uncertainty / W. F. Guthrie, H.-k. Liu, A. L. Rukhin, B. Toman, J. C. M. Wang, and N.-f. Zhang
Interval Computations and Interval-Related Statistical Techniques: Tools for Estimating Uncertainty of the Results of Data Processing and Indirect Measurements / Vladik Kreinovich
Parameter Estimation Based on Least Squares Methods / Alistair B. Forbes
Frequency and Time–Frequency Domain Analysis Tools in Measurement / P. M. Ramos, R. C. Martins, S. Rapuano, and P. Daponte
Data Fusion, Decision-Making, and Risk Analysis: Mathematical Tools and Techniques / P. S. Girão, O. Postolache, and J. M. D. Pereira
Comparing Results of Chemical Measurements: Some Basic Questions From Practice / Paul De Bièvre
Modelling of Measurements, System Theory, and Uncertainty Evaluation / Klaus-D. Sommer
Approaches to Data Assessment and Uncertainty Estimation in Testing / Wolfram Bremser and Werner Hässelbarth
Monte Carlo Modelling of Randomness / Alan G. Steele and Robert J. Douglas
Software Validation and Preventive Software Quality Assurance for Metrology / Norbert Greif and Dieter Richter
Virtual Instrumentation / O. Postolache, P. S. Girão, and J. M. D. Pereira
Internet-Enabled Metrology / Tanasko Tasic
Appendix: DVD Content
Index

Erscheint lt. Verlag 16.12.2008
Reihe/Serie Modeling and Simulation in Science, Engineering and Technology
Modeling and Simulation in Science, Engineering and Technology
Zusatzinfo XVIII, 486 p. 111 illus.
Verlagsort Boston
Sprache englisch
Themenwelt Mathematik / Informatik Informatik
Mathematik / Informatik Mathematik Angewandte Mathematik
Mathematik / Informatik Mathematik Statistik
Mathematik / Informatik Mathematik Wahrscheinlichkeit / Kombinatorik
Naturwissenschaften Physik / Astronomie
Technik Bauwesen
Schlagworte Calculus • calibration and testing • Data Analysis • data fusion • Data Modeling • fuzzy • fuzzy logic methods • Internet • interval mathematics • least squares method • Mathematica • Measurement Science • Metrology • Modeling • Probability • quality • Quality assurance • risk analysis • Statistica • Systems Theory • Uncertainty • Wavelet
ISBN-10 0-8176-4804-6 / 0817648046
ISBN-13 978-0-8176-4804-6 / 9780817648046
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