Advances in Imaging and Electron Physics (eBook)

Optics of Charged Particle Analyzers

eBook Download: EPUB

2010 | 1. Auflage
296 Seiten
Elsevier Science (Verlag)
978-0-12-381317-6 (ISBN)

Infos

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians

Inhalt

Font Cover 1
Advances in Imaging and Electron Physics 4
Copyright Page 5
Contents 6
Preface 8
Contributors 10
Future Contributions 12
Chapter 1: Energy Filtered X-Ray Photoemission Electron Microscopy 16
1. Introduction 17
2. History 18
2.1. Early Development 18
2.2. Development After 1980 19
2.3. EXPEEM 20
3. Principle and Experimental Setup of PEEM and EXPEEM 21
3.1. Photoemission and Light Source 21
3.2. PEEM and EXPEEM Optic 28
3.3. Energy Analyzer for PEEM 30
4. Chemical Application of EXPEEM 47
4.1. In Situ Observation of Surface Reactions 47
4.2. PEEM Application to Soft Material Surfaces 51
5. Summary and Future Prospects 52
References 53
Chapter 2: Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy 60
1. Introduction 61
2. Three-Dimensional Electron Microscopy 62
2.1. Electron Tomography 62
2.2. Optical Depth Sectioning 63
2.3. Scanning Confocal Microscopy 71
3. Coherent Imaging in SCEM 76
3.1. Image Formation for a Weak Scatterer 76
3.2. Contrast Transfer 77
3.3. Bright-Field Imaging 79
4. Partially Coherent Imaging in SCEM 81
4.1. Inelastic Scattering Formulation 81
4.2. Depth Discrimination for Individual Impurities 83
5. Conclusions 86
Acknowledgments 87
References 87
Chapter 3: New Dimensions for Field Emission: Effects of Structure in the Emitting Surface 92
1. Introduction 93
1.1. Assumptions and Notation 96
2. Behavior in Constant Potential 97
2.1. Two Slits with Electrons of Constant Speed: "Young’s Slits with Electrons" 97
2.2. Point Source with Uniform Potential 101
3. Behavior in Constant Field 103
3.1. Notation 103
3.2. Transversely Uniform Emission 104
3.3. Two Slits with Accelerated Electrons 107
3.4. Point Source with Accelerated Electrons 114
3.5. Ring Source with Accelerated Electrons 117
4. Summary of Results for Intensity 121
5. Behavior in Realistic Geometry 124
6. Interference Patterns 127
7. Electron-Optical Brightness 129
8. Discussion 129
9. Conclusions 132
Appendices 133
Acknowledgments 141
References 141
Chapter 4: Conductivity Imaging and Generalized Radon Transform: A Review 144
1. Introduction 145
2. The Reconstruction Process in EIT 147
2.1. Data-Fitting Methods 147
2.2. Sensitivity Methods 153
2.3. Backprojection Reconstruction Method 156
2.4. Other Reconstruction Approaches 164
3. Research Issues and Key Problem Areas of EIT 165
3.1. Three-Dimensionality 165
3.2. Ill-posedness, Sensitivity Considerations and Possible Sources of Error 166
3.3. Spatial Resolution Considerations 168
3.4. Anisotropy 169
3.5. Difference Imaging 169
3.6. Multifrequency Measurements 170
4. Application Areas of EIT 170
5. Conclusions and Future Research 173
Appendices 174
Definitions 174
Rules of Calculation 175
Acknowledgments 176
References 176
Chapter 5: Comparison of Color Demosaicing Methods 188
1. Introduction 189
2. Color Demosaicing 190
2.1. Introduction to Demosaicing 190
2.2. Basic Schemes and Demosaicing Rules 203
3. Demosaicing Schemes 213
3.1. Edge-Adaptive Demosaicing Methods 213
3.2. Estimated Color Correction 230
3.3. Demosaicing Using the Frequency Domain 236
3.4. Summary 242
4. Objective Evaluation Criteria for Demosaiced Images 242
4.1. Introduction 242
4.2. Demosaicing Artifacts 243
4.3. Classical Objective Criteria 247
4.4. Artifact-Sensitive Measurements 252
4.5. Measurements Dedicated to Low-Level Image Analysis 257
4.6. Summary 261
5. Quality Evaluation Results 261
5.1. Results of Classical Criteria 261
5.2. Results of Artifact-Sensitive Measurements 267
5.3. Discussion 269
5.4. Experimental Results for Edge Detection 272
6. Conclusion 276
References 277
Contents of Volumes 151–161 282
Index 286
Color Plates 292

Produkt-Details

• Erscheint lt. Verlag: 6.8.2010
• Mitarbeit: Herausgeber (Serie): Peter W. Hawkes
• Sprache: englisch
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Angewandte Physik
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Elektrodynamik
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• ISBN-10: 0-12-381317-4 / 0123813174
• ISBN-13: 978-0-12-381317-6 / 9780123813176