Surface Infrared and Raman Spectroscopy

Methods and Applications

W. Suëtaka (Autor)

Buch | Hardcover

270 Seiten

1995
Kluwer Academic/Plenum Publishers (Verlag)
978-0-306-44963-5 (ISBN)

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are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr.

1. Introduction.- 2. Infrared External Reflection Spectroscopy.- 3. Internal Reflection Spectroscopy.- 4. Infrared Emission Spectroscopy.- 5. Surface Raman Spectroscopy.- 6. Surface Enhanced Raman Scattering.

Reihe/Serie	Methods of Surface Characterization ; 3
Mitarbeit	Assistent: John T. Yates Jr.
Zusatzinfo	XIV, 270 p.
Verlagsort	New York
Sprache	englisch
Maße	156 x 234 mm
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
ISBN-10	0-306-44963-3 / 0306449633
ISBN-13	978-0-306-44963-5 / 9780306449635
Zustand	Neuware