Scanning Force Microscopy of Polymers (eBook)

G. Julius Vancso, Holger Schönherr (Autoren)

eBook Download: PDF

2010 | 2010
XIV, 248 Seiten
Springer Berlin (Verlag)
978-3-642-01231-0 (ISBN)

Infos

Scope of the Book Synthetic and natural polymers exhibit a complex structural and morphological hierarchy on multiple length scales [1], which determines their performance. Thus, research aiming at visualizing structure and morphology using a multitude of microscopy techniques has received considerable attention since the early days of polymer science and technology. Various well-developed techniques such as optical microscopy and different forms of electron microscopy (Scanning Electron Micr- copy, SEM; Transmission Electron Microscopy, TEM; Environmental Scanning Electron Microscopy, ESEM) allow one to view polymeric structure at different levels of magni?cation. These classical techniques, and their applications to po- mers, are well documented in the literature [2, 3]. The invention of Scanning Tunneling Microscopy (STM) inspired the devel- ment of Atomic Force Microscopy (AFM) and other forms of scanning proximity microscopes in the late 1980s [4, 5]. AFM, unlike STM, can be used to image n- conducting specimens such as polymers. In addition, AFM imaging is feasible in liquids, which has several advantages. Using liquid imaging cells the forces between specimen and AFM probe are drastically reduced, thus sample damage is prevented. In addition, the use of water as imaging medium opened up new applications aiming at imaging, characterizing, and analyzing biologically important systems.

Inhalt

Preface 7
Scope of the Book 7
To whom is this Volume Written? 8
Acknowledgments 9
References 10
Contents 11
Part I Principles: Theory and Practice 15
1 Physical Principles of Scanning Probe Microscopy Imaging 16
Abstract 16
1.1 Introduction 16
1.2 The Physical Principles of Atomic Force Microscopy 17
1.3 Modeling the AFM Force–Distance Curve: Interactions Between Tip and a Planar Half- Space 24
1.4 Static Theory of Deflected Cantilever Beams 26
References 36
2 Atomic Force Microscopy in Practice 38
Abstract 38
2.1 Assembling of AFMs for Operation 38
2.2 Practical Issues of AFM Operation 58
References 86
General Reading 87
Part II Case Studies: Macromolecules, Polymer Morphology and Polymer Surface Properties by AFM 89
3 Visualization of Macromolecules and Polymer Morphology 90
Abstract 90
3.1 Structural Hierarchy in Polymers 90
3.2 Single Component Systems 100
3.3 Biopolymers 129
3.4 Multicomponent Systems 151
3.5 Polymers in Applications: Effects of Processing and Processes 172
References 192
4 Polymer Surface and Interface Properties and ( Dynamic) Processes 199
Abstract 199
4.1 Adhesion 199
4.2 Friction 214
4.3 Surface Mechanical Properties 221
4.4 Thermal Properties and Thermal Transitions 227
4.5 Swelling and Solvent Effects 237
4.6 Chemical Reactions, Degradation, and Erosion 240
References 244
Appendices 247
A. AFM manufacturers 247
B. Probe Tip manufacturers / vendors 249
C. SPM software 251
D. Web-based resources 252
Index 253

Produkt-Details

• Erscheint lt. Verlag: 2.8.2010
• Reihe/Serie: Springer Laboratory
• Reihe/Serie: Springer Laboratory
• Zusatzinfo: XIV, 248 p. 150 illus.
• Verlagsort: Berlin
• Sprache: englisch
• Themenwelt: Naturwissenschaften ► Biologie
• Themenwelt: Naturwissenschaften ► Chemie ► Organische Chemie
• Themenwelt: Technik ► Maschinenbau
• Schlagworte: AFM • biopolymers • Copolymer • Homopolymer • Macromolecules • Makromoleküle • Microscopy • Mikroskopie • Morphology • PET • Polybuten • Polyethylen • Polymer • polymer analysis • Polymer Analytik • Polymere • Polymers • Polypropylen • Xanthan
• ISBN-10: 3-642-01231-0 / 3642012310
• ISBN-13: 978-3-642-01231-0 / 9783642012310