Semiconductor Radiation Detectors (eBook)

Device Physics

Gerhard Lutz (Autor)

eBook Download: PDF

2007 | 1st ed. 1999. 2nd printing 2007
XI, 353 Seiten
Springer Berlin (Verlag)
978-3-540-71679-2 (ISBN)

Infos

Starting from basic principles, this book describes the rapidly growing field of modern semiconductor detectors used for energy and position measurement radiation. The author, whose own contributions to these developments have been significant, explains the working principles of semiconductor radiation detectors in an intuitive way. Broad coverage is also given to electronic signal readout and to the subject of radiation damage.

Inhalt

Preface 5
Contents 7
1 Introduction 12
2 Semiconductors 16
2.1 Crystal Structure 16
2.2 Energy Bands 17
2.3 Intrinsic Semiconductors 20
2.4 Extrinsic Semiconductors 23
2.5 Carrier Transport in Semiconductors 25
2.6 Carrier Generation and Recombination in Semiconductors 30
2.7 Simultaneous Treatment of Carrier Generation and Transport 43
2.8 Summary and Discussion 46
3 Basic Semiconductor Structures 48
3.1 The p–n Diode Junction 48
3.2 Metal–Semiconductor Contact 65
3.3 Metal–Insulator–Semiconductor Structure 68
3.4 The n+-n or p+-p Structures 81
3.5 Summary and Discussion 82
4 Semiconductors as Detectors 86
4.1 The Properties of Intrinsic Semiconductor Materials 86
4.2 Properties of Extrinsic Semiconductor Materials 90
4.3 Insulators and Metals 95
4.4 Choice of Detector Material 98
5 Detectors for Energy 101
5.1 Unbiased Diode 101
5.2 Reverse-Biased Diode 106
5.3 Summary 113
6 Detectors for Position 115
6.1 Resistive Charge Division 115
6.2 Diode Strip Detectors 116
6.3 Strip Detectors with Double-Sided Readout 122
6.4 Strip Detectors with Integrated Capacitive Readout Coupling 126
6.5 Drift Detectors 131
6.6 Charge Coupled Devices as Detectors 143
6.7 Summary 157
7 The Electronics of the Readout Function 159
7.1 Operating Principles of Transistors 159
7.2 Noise Sources 186
7.3 The Measurement of Charge 196
7.4 Basic Electronic Circuits 201
7.5 Integrated Circuit Technologies 209
7.6 Integrated Circuits for Strip Detectors 213
7.7 Integrated Circuits for Pixel Detectors 216
7.8 Noise in Strip Detectors – Front-End Systems 217
7.9 Summary 231
8 The Integration of Detectors 234
8.1 Hybrid Systems of Detectors and Their Electronics 234
8.2 Detector-Technology-Compatible Electronics 238
9 Detectors with Intrinsic Amplification 244
9.1 Avalanche Diode 244
9.2 Depleted Field Effect Transistor Structure 248
9.3 DEPFET Pixel Detectors 259
10 Detector Technology 264
10.1 Production of Detector Substrates 264
10.2 Processing Sequence in Planar Technology 265
10.3 Technology Simulation 271
11 Device Stability and Radiation Hardness 272
11.1 Electrical Breakdown and Protection 272
11.2 Radiation Damage in Semiconductors 280
11.3 Radiation Damage in the Surface Region 306
11.4 Radiation Damage in Detectors 308
11.5 Radiation Damage in Electronics 312
11.6 Radiation Hardening Techniques 314
11.7 Summary 315
12 Device Simulation 317
12.1 Mathematical Formulation 317
12.2 Numerical Solution of Stationary Situations 323
12.3 Simulation of Time-Dependent Situations 334
Appendix A 337
Frequently Used Symbols 337
Appendix B 340
Physical Constants 340
References 341
Books and Reviews 341
Articles 342
Index 348

Produkt-Details

• Erscheint lt. Verlag: 15.6.2007
• Zusatzinfo: VIII, 283 p.
• Verlagsort: Berlin
• Sprache: englisch
• Themenwelt: Naturwissenschaften ► Chemie
• Themenwelt: Naturwissenschaften ► Physik / Astronomie
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Themenwelt: Technik ► Maschinenbau
• Schlagworte: Electronics • Particle physics • semiconductor • Signal • Simulation
• ISBN-10: 3-540-71679-3 / 3540716793
• ISBN-13: 978-3-540-71679-2 / 9783540716792