Nicht aus der Schweiz? Besuchen Sie lehmanns.de
Für diesen Artikel ist leider kein Bild verfügbar.

X–Ray Diffraction by Polycrystalline Materials

Software / Digital Media
352 Seiten
2010
Wiley-Blackwell (Hersteller)
978-0-470-61240-8 (ISBN)
CHF 318,15 inkl. MwSt
  • Keine Verlagsinformationen verfügbar
  • Artikel merken
This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.

Rene Guinebretiere is a senior lecturer at the Ecole Nationale Superieure de Ceramiques Industrielles in Limoges, France, and teaches X-ray diffraction. His research activities are the study of materials using X-ray diffraction at the SPCTS International Laboratory in France.

Preface. Acknowledgements. An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction. Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results. Chapter 1. Kinematic and geometric theories of X-ray diffraction. Chapter 2. Instrumentation used for X-ray diffraction. Chapter 3. Data processing, extracting information. Chapter 4. Interpreting the results. 5. Scattering and diffraction on imperfect crystals. Part 2. Microstructual Analysis. Chapter 6. Microstructural study of randomly oriented polycrystalline samples. Chapter 7. Microstructural study of thin films. Bibliography. Index.

Erscheint lt. Verlag 13.1.2010
Verlagsort Hoboken
Sprache englisch
Themenwelt Naturwissenschaften Chemie
Technik Maschinenbau
ISBN-10 0-470-61240-1 / 0470612401
ISBN-13 978-0-470-61240-8 / 9780470612408
Zustand Neuware
Haben Sie eine Frage zum Produkt?
Mehr entdecken
aus dem Bereich