X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

Martin Schmidbauer (Autor)

Buch | Softcover

X, 204 Seiten

2010 | 1. Softcover reprint of hardcover 1st ed. 2004
Springer Berlin (Verlag)
978-3-642-05769-4 (ISBN)

Artikel merken

This monograph represents a critical survey of the outstanding capabilities of X-ray
diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

A Brief Introduction to the Topic.- Basic Principles of X-Ray Diffuse Scattering on Mesoscopic Structures.- Experimental Optimization.- A Model System: LPE SiGe/Si(001) Islands.- Dynamical Scattering at Grazing Incidence.- Characterization of Quantum Dots.- Characterization of Interface Roughness.- Appendix.

Erscheint lt. Verlag	1.12.2010
Reihe/Serie	Springer Tracts in Modern Physics
Zusatzinfo	X, 204 p.
Verlagsort	Berlin
Sprache	englisch
Maße	155 x 235 mm
Gewicht	331 g
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Elektrodynamik
	Naturwissenschaften ► Physik / Astronomie ► Optik
	Technik ► Elektrotechnik / Energietechnik
	Technik ► Maschinenbau
Schlagworte	mesoscopic systems • quantum dot • scattering • Self-organized growth • semiconductor • Semiconductors nanostructures • X-ray diffuse scattering
ISBN-10	3-642-05769-1 / 3642057691
ISBN-13	978-3-642-05769-4 / 9783642057694
Zustand	Neuware