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Modern Developments in X-Ray and Neutron Optics -

Modern Developments in X-Ray and Neutron Optics

Buch | Softcover
XXIV, 534 Seiten
2010 | 1. Softcover reprint of hardcover 1st ed. 2008
Springer Berlin (Verlag)
978-3-642-09398-2 (ISBN)
CHF 299,55 inkl. MwSt
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This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation as well as recent theoretical approaches to modelling and ray-tracing the X-ray and neutron optical systems. It is based on the joint research activities of specialists in X-ray and neutron optics from 11 countries, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002--2006. The chapters are written by leading specialists from European laboratories, universities and large facilities. In addition to new ideas and concepts, the contents provide a large amount of practical information about recently implemented devices and methods.

Dr. Thomas Krist war in der Industrie als Konstrukteur, Entwicklungsingenieur und Betriebsleiter tätig, dann freier Journalist und Autor von zahlreichen Veröffentlichungen und Fachbüchern.

Theoretical Approaches and Calculations.- X-Ray and Neutron Optical Systems.- The BESSY Raytrace Program RAY.- Neutron Beam Phase Space Mapping.- Raytrace of Neutron Optical Systems with RESTRAX.- Wavefront Propagation.- Theoretical Analysis of X-Ray Waveguides.- Focusing Optics for Neutrons.- Volume Effects in Zone Plates.- Nano-Optics Metrology.- Slope Error and Surface Roughness.- The Long Trace Profilers.- The Nanometer Optical Component Measuring Machine.- Shape Optimization of High Performance X-Ray Optics.- Measurement of Groove Density of Diffraction Gratings.- The COST P7 Round Robin for Slope Measuring Profilers.- Hartmann and Shack-Hartmann Wavefront Sensors for Sub-nanometric Metrology.- Extraction of Multilayer Coating Parameters from X-Ray Reflectivity Data.- Refection/Refraction Optics.- Hard X-Ray Microoptics.- Capillary Optics for X-Rays.- Reflective Optical Arrays.- Reflective Optical Structures and Imaging Detector Systems.- CLESSIDRA: Focusing Hard X-Rays Efficiently with Small Prism Arrays.- Multilayer Optics Developments.- Neutron Supermirror Development.- Stress Reduction in Multilayers Used for X-Ray and Neutron Optics.- Multilayers with Ultra-Short Periods.- Specially Designed Multilayers.- Diffraction Optics.- Diffractive-Refractive Optics: X-ray Crystal Monochromators with Profiled Diffracting Surfaces.- Neutron Multiple Reflections Excited in Cylindrically Bent Perfect Crystals and Their Possible use for High-Resolution Neutron Scattering.- Volume Modulated Diffraction X-Ray Optics.- High Resolution 1D and 2D Crystal Optics Based on Asymmetric Diffractors.- Thermal Effects under Synchrotron Radiation Power Absorption.

Erscheint lt. Verlag 25.11.2010
Reihe/Serie Springer Series in Optical Sciences
Zusatzinfo XXIV, 534 p. 299 illus., 5 illus. in color.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Gewicht 836 g
Themenwelt Naturwissenschaften Physik / Astronomie Optik
Technik Elektrotechnik / Energietechnik
Schlagworte Absorption • Design • Development • diffraction • Imaging • machine • Measurement • Metrology • monochromator • Neutron Optics • Optics • Optimization • polarization • Prism • refraction • Sensor • shape optimization • X-Ray • X-ray optics
ISBN-10 3-642-09398-1 / 3642093981
ISBN-13 978-3-642-09398-2 / 9783642093982
Zustand Neuware
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