Surface Analysis Methods in Materials Science

D.J. O'Connor, Brett A. Sexton, Roger S.C. Smart (Herausgeber)

Buch | Softcover

XXVI, 585 Seiten

2010 | 2. Softcover reprint of hardcover 2nd ed. 2003
Springer Berlin (Verlag)
978-3-642-07458-5 (ISBN)

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The success of the first edition of this broad appeal book prompted the prepa ration of an updated and expanded second edition. The field of surface anal ysis is constantly changing as it answers the need to provide more specific and more detailed information about surface composition and structure in advanced materials science applications. The content of the second edition meets that need by including new techniques and expanded applications. Newcastle John O'Connor Clayton Brett Sexton Adelaide Roger Smart January 2003 Preface to the First Edition The idea for this book stemmed from a remark by Philip Jennings of Mur doch University in a discussion session following a regular meeting of the Australian Surface Science group. He observed that a text on surface anal ysis and applications to materials suitable for final year undergraduate and postgraduate science students was not currently available. Furthermore, the members of the Australian Surface Science group had the research experi ence and range of coverage of surface analytical techniques and applications to provide a text for this purpose. A list of techniques and applications to be included was agreed at that meeting. The intended readership of the book has been broadened since the early discussions, particularly to encompass industrial users, but there has been no significant alteration in content.

I Introduction.- 1 Solid Surfaces, Their Structure and Composition.- 2 UHV Basics.- II Techniques.- 3 Electron Microscope Techniques for Surface Characterization.- 4 Sputter Depth Profiling.- 5 SIMS - Secondary Ion Mass Spectrometry.- 6 Auger Electron Spectroscopy and Microscopy - Techniques and Applications.- 7 X-Ray Photoelectron Spectroscopy.- 8 Vibrational Spectroscopy of Surfaces.- 9 Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis.- 10 Materials Characterization by Scanned Probe Analysis.- 11 Low Energy Ion Scattering.- 12 Reflection High Energy Electron Diffraction.- 13 Low Energy Electron Diffraction.- 14 Ultraviolet Photoelectron Spectroscopy of Solids.- 15 EXAFS.- III Processes and Applications.- 16 Minerals, Ceramics and Glasses.- 17 Characterization of Catalysts by Surface Analysis.- 18 Application to Semiconductor Devices.- 19 Characterisation of Oxidised Surfaces.- 20 Coated Steel.- 21 Thin Film Analysis.- 22 Identification of Adsorbed Species.- 23 Surface Analysis of Polymers.- 24 Glow Discharge Optical Emission Spectrometry.- IV Appendix.- Acronyms Used in Surface and Thin Film Analysis.- Surface Science Bibliography.

I teach graduate courses on Surface Analysis and on Surface Science (with a strong component of Surface Analysis). I was so impressed with the first edition of this book that I intended to adopt it for my class but, unfortunately, it was soon out-of-print. I encouraged John O'Connor to prepare another edition of this jewel that I could use in the future. What distinguishes this book from others is the very unusual breadth. It covers fundamentals, practical issues of analyses, and concrete applications to the analysis of metals, semiconductors, polymers, and ceramics (including minerals).

Quote from Prof. Raul Baragiola, University of Virginia

From the reviews of the second edition:

"More than 30 experts have contributed to this book providing a wealth of expertise based on theoretical as well as practical background. ... the book can be recommended not only to university students but also to scientists and engineers working in industry. It will help to find the appropriate method, or better the combination of methods, which will be needed to solve problems in process control and failure analysis." (W. Oesterle, Werkstoffe und Korrosion/Materials and Corrosion, Vol. 55 (3), 2004)

Erscheint lt. Verlag	1.12.2010
Reihe/Serie	Springer Series in Surface Sciences
Zusatzinfo	XXVI, 585 p.
Verlagsort	Berlin
Sprache	englisch
Maße	155 x 235 mm
Gewicht	915 g
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
	Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
	Technik ► Maschinenbau
Schlagworte	Ceramics • Chemistry • Electron Microscope • electron spectroscopy • EXAFS • Helium-Atom-Streuung • materials engineering • Materials Science • Metal • Oberfläche • Physics • Polymer • Problemlösen • Science • semiconductor • Sims • spectroscopy • surface analysis • Surface Physics • Surface Science • surfaces of materials • Vibration
ISBN-10	3-642-07458-8 / 3642074588
ISBN-13	978-3-642-07458-5 / 9783642074585
Zustand	Neuware