Scanning Probe Microscopy
The Lab on a Tip
Seiten
2011
|
Softcover reprint of the original 1st ed. 2004
Springer Berlin (Verlag)
978-3-642-07737-1 (ISBN)
Springer Berlin (Verlag)
978-3-642-07737-1 (ISBN)
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Two decades after its invention, scanning probe microscopy has become a widely used method in laboratories as diverse as industrial magnetic stor age development or structural biology. Consequently, the community of users ranges from biologists and medical researchers to physicists and engineers, all of them exploiting the unrivalled resolution and profiting from the relative simplicity of the experimental implementation. In recent years the authors have taught numerous courses on scanning probe microscopy, normally in combination with hands-on student experi ments. The audiences ranged from physics freshmen to biology post-docs and even high-school teachers. We found it of particular importance to cover not only the physical principles behind scanning probe microscopy but also ques tions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. With this book our intention is to provide a gen eral textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy labora tory.
1 Introduction to Scanning Probe Microscopy.- 2 Introduction to Scanning Tunneling Microscopy.- 3 Force Microscopy.- 4 MFM and Related Techniques.- 5 Other Members of the SPM Family.- 6 Artifacts in SPM.- 7 Prospects for SPM.- References.
| Erscheint lt. Verlag | 22.9.2011 |
|---|---|
| Reihe/Serie | Advanced Texts in Physics |
| Zusatzinfo | X, 210 p. 204 illus., 15 illus. in color. |
| Verlagsort | Berlin |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Gewicht | 344 g |
| Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
| Naturwissenschaften ► Physik / Astronomie | |
| Technik ► Maschinenbau | |
| Schlagworte | Experiment • Helium-Atom-Streuung • Microscopy • Nanoscience • Pes • Scanning Probe Microscopy • Surface Science |
| ISBN-10 | 3-642-07737-4 / 3642077374 |
| ISBN-13 | 978-3-642-07737-1 / 9783642077371 |
| Zustand | Neuware |
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