Multi-Component VSP Analysis for Applied Seismic Anisotropy
Pergamon (Verlag)
978-0-08-042439-2 (ISBN)
- Titel ist leider vergriffen;
keine Neuauflage - Artikel merken
The vertical seismic profile, acquired with an array of 3C receivers and either a single source or several arranged in a multi-component configuration, provides an ideal high fidelity calibration tool for seismic projects involved in the application of seismic anisotropy. This book catalogues the majority of specialized tools necessary to work with P-P, P-S and S-S data from such VSP surveys at the acquisition design, processing and interpretation stages. In particular, it discusses 3C, 4C, 6C and 9C VSP, marine and land surveys with near and multiple offsets (walkways), azimuths (walkarounds) or a combination of both. These are considered for TIH or TIV flavours of seismic anisotropy arising from cracks, fractures, sedimentary layering, and shales. The anisotropic adaptation of familiar seismic methods for velocity analysis and inversion, reflected amplitude interpretation, are given together with more multi-component specific algorithms based upon the principles dictated by the vector convolutional model.
Thus, multi-component methods are described that provide tests and compensation for source or receiver vector fidelity, tool rotation correction, layer stripping, near-surface correction, wavefield separation, and the Alford rotation with its variants. The work will be of interest to geophysicists involved in research or the application of seismic anisotropy using multi-component seismic.
1. Introduction. 2. Anisotropic replacement media. 2.1 Cracks. 2.2 Fractures. 2.3 Sedimentary layering (TIV). 2.4 Shales (TIV). 2.5 Intersecting systems of aligned features. 2.6 Appendix: the bond transformation. 3. Fundamentals of seismic anisotropy analysis. 3.1 Shales and sedimentary layering (TIV). 3.2 Vertical cracks/fractures (TIH). 3.3 Intersecting systems - monoclinic and orthorhombic symmetry. 3.4 Appendix: the equal-area projection. 4. Pre-requisites for near-offset VSP analysis. 4.1 The vector convolutional model. 4.2 Near-surface correction. 4.3 Correction for receiver tool mis-orientation. 4.4 Distortion at interfaces. 5. Anisotropy analysis from near-offset VSP I - symmetry and uniformity. 5.1 Estimation of shear-wave anisotropy. 5.2 Data examples of anisotropy estimation. 5.3 Normal incidence reflectivity. 6. Anisotropy analysis from far-offset VSP II - asymmetry and non-uniformity. 6.1 Acquisition inaccuracy. 6.2 Non-uniformity with depth. 6.3 Inherent non-orthogonality. 6.4 Appendix: transmission and reflection coefficients at a polarization change. 7. Multiple-offset VSP - kinematics. 7.1 Wavefield separation using a multi-component receiver. 7.2 Anisotropy estimation using local phase slowness. 7.3 Moveout correction and velocity analysis. 8. Multiple-offset VSP - dynamics. 8.1 The extended vector convolutional model. 8.2 Near-surface correction. 8.3 Converted shear wave analysis (TIH). 8.4 Amplitude variations with offset and azimuth for TIH and TIV. 9. The road ahead. 9.1 Fixed near-offset VSP. 9.2 Fixed far-offset VSP. 9.3 Walk-away VSP. 9.4 Rig- and normal incidence VSP. 9.5 The future impact of recent advances in borehole sensors. 9.6 Interpretation of the anisotropy parameters. 9.7 Time-lapse VSP. Appendix - shear-wave birefringence analysis. A.1 Polarization diagrams. A.2 Neural networks. A.3 Covariance matrix. A.4 Receiver rotation discriminants. A.5 Spectral interference. A.6 Singular value decomposition. A.7 Wavelet transform. References. Index.
| Erscheint lt. Verlag | 31.7.1998 |
|---|---|
| Reihe/Serie | Handbook of Geophysical Exploration: Seismic Exploration ; v. 26 |
| Zusatzinfo | Illustrations |
| Verlagsort | Amsterdam |
| Sprache | englisch |
| Maße | 165 x 235 mm |
| Gewicht | 816 g |
| Themenwelt | Schulbuch / Wörterbuch |
| Naturwissenschaften ► Geowissenschaften ► Geologie | |
| Naturwissenschaften ► Geowissenschaften ► Geophysik | |
| ISBN-10 | 0-08-042439-2 / 0080424392 |
| ISBN-13 | 978-0-08-042439-2 / 9780080424392 |
| Zustand | Neuware |
| Haben Sie eine Frage zum Produkt? |
aus dem Bereich
