X-Ray Optics and Microanalysis
Seiten
2010
American Institute of Physics (Verlag)
978-0-7354-0764-0 (ISBN)
American Institute of Physics (Verlag)
978-0-7354-0764-0 (ISBN)
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Reports the progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams, electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.
"ICXOM Series" is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.
"ICXOM Series" is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.
| Erscheint lt. Verlag | 4.6.2010 |
|---|---|
| Reihe/Serie | AIP Conference Proceedings / Atomic, Molecular, Chemical Physics ; 1221 |
| Zusatzinfo | Illustrations |
| Verlagsort | New York |
| Sprache | englisch |
| Einbandart | gebunden |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
| Naturwissenschaften ► Physik / Astronomie ► Plasmaphysik | |
| ISBN-10 | 0-7354-0764-9 / 0735407649 |
| ISBN-13 | 978-0-7354-0764-0 / 9780735407640 |
| Zustand | Neuware |
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