Volume Microscopy

Multiscale Imaging with Photons, Electrons, and Ions

Irene Wacker, Eric Hummel, Steffen Burgold, Rasmus Schröder (Herausgeber)

Buch | Hardcover

306 Seiten

2020 | 1st ed. 2020
Springer-Verlag New York Inc.
978-1-0716-0690-2 (ISBN)

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This volume discusses different approaches to workflows for large volume electron microscopy - from preparation of samples to their imaging in a variety of microscopes - in some cases also applying correlative techniques. The chapters in this book cover topics such as correlative super resolution and electron microscopy to detect molecules in their native cellular context; low-threshold access to serial section arrays; improving serial blockface SEM by focal charge compensation; FIBSEM analysis of interfaces between hard technical devices and soft neuronal tissue; and image processing for volume electron microscopy. In Neuromethods series style, chapters include the kind of detail and key advice from the specialists needed to get successful results in your laboratory.

Cutting-edge and authoritative, Volume Microscopy: Multiscale Imaging with Photons, Electrons, and Ions is a valuable resource for novice and expert scientists interested in learning more about this evolving field.

Correlative Super Resolution and Electron Microscopy to Detect Molecules in their Native Cellular Context.- Multi-Color Super-Resolution Microscopy: Revealing the Nano-World of Astrocytes In Situ.- High Resolution Molecular Imaging and Its Applications in Brain and Synapses.- Advancing Array Tomography to Study the Fine Ultrastructure of Identified Neurons in Zebrafish (Danio rerio).- A Low-Tech Approach to Serial Section Arrays.- Large Volumes in Ultrastructural Neuropathology Imaged by Array Tomography of Routine Diagnostic Samples.- Correlative Ultrastructural Analysis of Functionally Modulated Synapses using Automated Tape-Collecting Ultramicrotome and SEM Array Tomography.- Large-Scale Automated Serial Section Imaging using a Multi-Beam Scanning Electron Microscope.- Improving Serial Blockface SEM by Focal Charge Compensation.- Using X-Ray Microscopy to Increase Targeting Accuracy in Serial Block-Face Scanning Electron Microscopy.- FIBSEM Analysis of Interfaces between Hard Technical Devices and Soft Neuronal Tissue.- Transforming FIB-SEM Systems for Large Volume Connectomics and Cell Biology.- Image Processing for Volume Electron Microscopy.- Forget about Electron Micrographs: A Novel Guide for using 3D Models for Quantitative Analysis of Dense Reconstructions.

Erscheinungsdatum	10.07.2020
Reihe/Serie	Neuromethods ; 155
Zusatzinfo	88 Illustrations, color; 19 Illustrations, black and white; XVII, 306 p. 107 illus., 88 illus. in color. With online files/update.
Verlagsort	New York, NY
Sprache	englisch
Maße	178 x 254 mm
Themenwelt	Medizin / Pharmazie ► Studium
	Naturwissenschaften ► Biologie ► Humanbiologie
	Naturwissenschaften ► Biologie ► Zoologie
	Naturwissenschaften ► Chemie ► Analytische Chemie
	Technik ► Maschinenbau
ISBN-10	1-0716-0690-5 / 1071606905
ISBN-13	978-1-0716-0690-2 / 9781071606902
Zustand	Neuware