Digital Noise Monitoring of Defect Origin

Telman Aliev (Autor)

Buch | Hardcover

224 Seiten

2007 | 2007 ed.
Springer-Verlag New York Inc.
978-0-387-71753-1 (ISBN)

Infos

Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.

Inhalt

Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features.- Position-Binary Technology of Monitoring Defect at its Origin.- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin.- Robust Correlation Monitoring of a Defect at its Origin.- Spectral Monitoring of a Defect's Origin.- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier.- The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier.

Produkt-Details

• Reihe/Serie: Lecture Notes in Electrical Engineering ; 2
• Zusatzinfo: XII, 224 p.
• Verlagsort: New York, NY
• Sprache: englisch
• Maße: 155 x 235 mm
• Themenwelt: Mathematik / Informatik ► Mathematik ► Angewandte Mathematik
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• ISBN-10: 0-387-71753-6 / 0387717536
• ISBN-13: 978-0-387-71753-1 / 9780387717531
• Zustand: Neuware