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Statistical Regression with Measurement Error - John W.Van Ness, Chi-Lun Cheng

Statistical Regression with Measurement Error

Buch | Hardcover
256 Seiten
1999
Hodder Arnold (Verlag)
978-0-340-61461-7 (ISBN)
CHF 85,45 inkl. MwSt
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Covering the field of statistics called measurement error models, this work includes a full discussion of functional and structural models as well as the more general ultrastructural model. There are set problems at the end of each chapter, and computational methods are considered.
Covering the field of statistics called measurement error models, this work includes a full discussion of functional and structural models as well as the more general ultrastructural model. The material is presented at a level appropriate for beginning graduate students and includes problems at the end of each chapter to aid learning. Computational methods are considered, and the rationale is to provide an intermediate level survey of the field of measurement error models without too much mathematical detail. Topics covered include: model identifiability; parameter estimation; confidence intervals; asymptotic theory; finite sample properties; orthogonal regression; modified lease squares methods; instrumental variable methods; the linear and non-linear Berkson Model; calibration; and computational methods.

Introduction to linear measurement error models; properties of estimates; modifying least squares and comparing model assumptions; non-normal models; multivariate models; nonlinear models; robust estimation in measurement error models; computational methods.

Erscheint lt. Verlag 26.2.1999
Reihe/Serie Kendall's Library of Statistics ; No. 6
Zusatzinfo 11d.
Verlagsort London
Sprache englisch
Maße 161 x 240 mm
Gewicht 599 g
Themenwelt Mathematik / Informatik Mathematik Statistik
ISBN-10 0-340-61461-7 / 0340614617
ISBN-13 978-0-340-61461-7 / 9780340614617
Zustand Neuware
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