Applied Rasch Measurement: A Book of Exemplars
Springer-Verlag New York Inc.
978-1-4020-3072-7 (ISBN)
Measurement and the Rasch model.- Classical Test Theory.- Objective Measurement.- The Rasch Model Explained.- Applications of the Rasch Model — Tests and Competencies.- Monitoring Mathematics Achievement over Time.- Manual and Automatic Estimates of Growth and Gain Across Year Levels: How Close is Close?.- Japanese Language Learning and the Rasch Model.- Chinese Language Learning and the Rasch Model.- Employing the Rasch Model to Detect Biased Items.- Raters and Examinations.- Comparing Classical and Contemporary Analyses and Rasch Measurement.- Combining Rasch Scaling and Multi-Level Analysis.- Applications of the Rasch Model — Attitudes Scales and Views.- Rasch and Attitude Scales: Explanatory Style.- Science Teachers’ Views on Science, Technology and Society Issues.- Estimating the Complexity of Workplace Rehabilitation Tasks Using Rasch Analysis.- Creating a Scale as a General Measure of Satisfaction for Information and Communication Technology Users.- Extensions of the Rasch model.- Multidimensional Item Responses: Multimethod-Multitrait Perspectives.- Information Functions for the General Dichotomous Unfolding Model.- Past, Present and Future: An Idiosyncratic View of Rasch Measurement.- Epilogue.- Our Experiences and Conclusion.
Erscheint lt. Verlag | 15.2.2005 |
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Reihe/Serie | Education in the Asia-Pacific Region: Issues, Concerns and Prospects ; 4 |
Zusatzinfo | XVIII, 360 p. |
Verlagsort | New York, NY |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Geisteswissenschaften ► Psychologie ► Test in der Psychologie |
Mathematik / Informatik ► Mathematik ► Wahrscheinlichkeit / Kombinatorik | |
Sozialwissenschaften ► Pädagogik ► Allgemeines / Lexika | |
ISBN-10 | 1-4020-3072-X / 140203072X |
ISBN-13 | 978-1-4020-3072-7 / 9781402030727 |
Zustand | Neuware |
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