Noise Contamination in Nanoscale VLSI Circuits
Springer International Publishing (Verlag)
978-3-031-12753-3 (ISBN)
Selahattin Sayil received the M.Sc. degree from the Pennsylvania State University, University Park, PA, in 1996 and the Ph.D. degree in Electrical Engineering from Vanderbilt University, TN, in 2000. He is currently a Professor and Distinguished Faculty Fellow in Electrical Engineering at Lamar University, where he leads the VLSI CAD and Signal Integrity Group.
His current research interests include mitigation of radiation effects in VLSI, interconnect delay and noise analysis, low-power design and testing. His teaching interests include online teaching, high-impact online labs and virtual team learning. He has authored two books, two book chapters and published near thirty refereed journal articles that include special feature articles, and presented at many international conferences. He is a member of IEEE and serves as an Associate Editor for International Journal of Electronics.
Introduction.- Interconnect Noise.- Clock Noise and Uncertainty.- Power Supply Noise.- Substrate Coupling Noise.- Radiation Induced Soft Error Mechanisms.- Thermally Induced Errors.- Impact of Process Variations.
| Erscheinungsdatum | 03.09.2023 |
|---|---|
| Reihe/Serie | Synthesis Lectures on Digital Circuits & Systems |
| Zusatzinfo | XI, 136 p. 95 illus., 42 illus. in color. |
| Verlagsort | Cham |
| Sprache | englisch |
| Maße | 168 x 240 mm |
| Gewicht | 262 g |
| Themenwelt | Informatik ► Weitere Themen ► Hardware |
| Technik ► Elektrotechnik / Energietechnik | |
| Schlagworte | CMOS Design & Reliability textbook • Interconnect Noise • Radiation Induced Soft Error • VLSI Design for Reliability textbook • VLSI Noise textbook |
| ISBN-10 | 3-031-12753-6 / 3031127536 |
| ISBN-13 | 978-3-031-12753-3 / 9783031127533 |
| Zustand | Neuware |
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