VLSI Design and Test

23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers

Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma (Herausgeber)

Buch | Softcover

775 Seiten

2019 | 1st ed. 2019
Springer Verlag, Singapore
978-981-329-766-1 (ISBN)

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This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

Analog and Mixed Signal Design.- Computing Architecture and Security.- Hardware Design and Optimization.- Low Power VLSI and Memory Design. -Device Modelling.- Hardware Implementation.

Erscheinungsdatum	23.08.2019
Reihe/Serie	Communications in Computer and Information Science ; 1066
Zusatzinfo	336 Illustrations, color; 209 Illustrations, black and white; XVI, 775 p. 545 illus., 336 illus. in color.
Verlagsort	Singapore
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Informatik ► Netzwerke ► Sicherheit / Firewall
	Informatik ► Theorie / Studium ► Künstliche Intelligenz / Robotik
	Informatik ► Weitere Themen ► Hardware
ISBN-10	981-329-766-2 / 9813297662
ISBN-13	978-981-329-766-1 / 9789813297661
Zustand	Neuware