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High Performance Memory Testing

Design Principles, Fault Modeling and Self-Test

R. Dean Adams (Autor)

Buch | Hardcover

250 Seiten

2002
Springer-Verlag New York Inc.
978-1-4020-7255-0 (ISBN)

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Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Test of Memories.- Opening Pandora’s Box.- Static Random Access Memories.- Multi-Port Memories.- Silicon On Insulator Memories.- Content Addressable Memories.- Dynamic Random Access Memories.- Non-Volatile Memories.- Memory Testing.- Memory Faults.- Memory Patterns.- Memory Self Test.- BIST Concepts.- State Machine BIST.- Micro-Code BIST.- BIST and Redundancy.- Design For Test and BIST.- Conclusions.

Reihe/Serie	Frontiers in Electronic Testing ; 22A
Zusatzinfo	XIV, 250 p.
Verlagsort	New York, NY
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Informatik ► Weitere Themen ► CAD-Programme
	Informatik ► Weitere Themen ► Hardware
	Technik ► Elektrotechnik / Energietechnik
ISBN-10	1-4020-7255-4 / 1402072554
ISBN-13	978-1-4020-7255-0 / 9781402072550
Zustand	Neuware