Fault Tolerant Architectures for Cryptography and Hardware Security
Springer Verlag, Singapore
978-981-13-3819-9 (ISBN)
Sikhar Patranabis is a PhD student in the Department of Computer Science and Engineering, Indian Institute of Technology at Kharagpur, India. Prior to this, he obtained his BTech degree in Computer Science and Engineering, from IIT Kharagpur in the year 2015. His research interests include Fault Analysis of Ciphers, Side Channel Attacks, Hardware Security, and Secured data sharing protocols for the cloud. He is the recipient of the prestigious President Gold Medal for securing the highest grade point among all the outgoing students of the batch of 2015. Debdeep Mukhopadhyay is currently an Associate Professor at the Department of Computer Science and Engineering, Indian Institute of Technology at Kharagpur, India. At IIT Kharagpur he initiated the Secured Embedded Architecture Laboratory (SEAL), with a focus on Embedded Security and Side Channel Attacks. Prior to this, he worked as a visiting Associate Professor of NYU-Shanghai. He had also served as an Assistant Professor at IIT Madras, India and as a Visiting Researcher at NYU Polytechnic School of Engineering under the Indo-US STF Fellowship. He holds a PhD, an MS, and a B. Tech from IIT Kharagpur, India. Mukhopadhyay’s research interests are Cryptography, Hardware Security, and VLSI. His books include Cryptography and Network Security (Mc Graw Hills), Hardware Security: Design, Threats, and Safeguards (CRC Press), and Timing Channels in Cryptography (Springer). He has written more than 100 papers in peer-reviewed conferences and journals and has collaborated with several Indian and Foreign Organizations. Mukhopadhyay is the recipient of the prestigious Young Scientist award from the Indian National Science Academy, the Young Engineer award from the Indian National Academy of Engineers, and is the Young Associate of the Indian Academy of Science. He was also awarded the Outstanding Young Faculty fellowship in 2011 from IIT Kharagpur, and the Techno-Inventor Best PhD award by the Indian Semiconductor Association.
Introduction to Fault Analysis.- Classical Fault Analysis.- Recent Trends and Advances in Fault Analysis.- Automation of Fault Analysis.- Countermeasures and Fault Tolerant Architectures.- Practical Perspectives of Fault Tolerant Design.
Erscheinungsdatum | 21.01.2019 |
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Reihe/Serie | Computer Architecture and Design Methodologies |
Zusatzinfo | 39 Illustrations, color; 36 Illustrations, black and white; XII, 240 p. 75 illus., 39 illus. in color. |
Verlagsort | Singapore |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Informatik ► Theorie / Studium ► Kryptologie |
Technik ► Bauwesen | |
Technik ► Elektrotechnik / Energietechnik | |
ISBN-10 | 981-13-3819-1 / 9811338191 |
ISBN-13 | 978-981-13-3819-9 / 9789811338199 |
Zustand | Neuware |
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