Interconnects in VLSI Design
Springer (Verlag)
978-0-7923-7997-3 (ISBN)
Recent Development in Interconnect Modeling.- Study of Parallel Plane Mode Excitation at a Double-Layer Via Interconnect Using the FDTD Method.- A Testchip for Analysis of Signal Integrity and Ground-Bounce Effects in Deep-Submicron Technology.- Measurement of Signal Integrity within Deep-Submicron Interconnect.- Considering Magnetic Interference in Board-Level Interconnect Design.- Input Shape Influence over Interconnect Performances.- Comparison of RL and RLC Interconnect Models in the Simultaneous Switching Noise Simulations.- Black-Box Modeling of Digital Devices>.- Advanced Modeling of Nonuniform Interconnects.- Modeling of Passive Components for Radio Frequency Applications.- Electrical Performance of Capacitors Integrated in Multi-Layered Printed Circuit Boards.- Characteristic Impedance Measurement on Silicon.- Efficient Computation of the Parameters of Parallel Transmission Lines in IC Interconnects.- Modeling of Optical Interconnections for Data Transmission within High-Speed Electronic Systems.- Quantifying the Impact of Optical Interconnect Latency on the Performance of Optoelectronic FPGA’s.- PIN CMOS Receivers for Optical Interconnects.- BICMOS Receiver OEIC for Optical Interconnect.- Electrical/Optical Circuit Boards: Technology - Design - Modeling.
Zusatzinfo | VII, 236 p. |
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Verlagsort | Dordrecht |
Sprache | englisch |
Maße | 170 x 244 mm |
Themenwelt | Mathematik / Informatik ► Informatik ► Theorie / Studium |
Informatik ► Weitere Themen ► CAD-Programme | |
Technik ► Elektrotechnik / Energietechnik | |
ISBN-10 | 0-7923-7997-7 / 0792379977 |
ISBN-13 | 978-0-7923-7997-3 / 9780792379973 |
Zustand | Neuware |
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