Basic ESD and I/O Design
Seiten
1999
Wiley-Interscience (Verlag)
978-0-471-25359-4 (ISBN)
Wiley-Interscience (Verlag)
978-0-471-25359-4 (ISBN)
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This book addresses the large gap between the fragmented research ESD (Electrostatic Discharge) and design practices used in VLSI design. It brings a simplified design perspective to IO (Input/Output) and ESD design, and presents a common understanding for the IO designer about ESD constraints and for the ESD Process designer about IO requirements.
The first comprehensive guide to ESD protection and I/O design
Basic ESD and I/O Design is the first book devoted to ESD (electrostatic discharge) protection and input/output design. Addressing the growing demand in industry for high-speed I/O designs, it bridges the gap between ESD research and current VLSI design practices and provides a much-needed reference for practicing engineers who are frequently called upon to learn the subject on the job.
This volume presents an integrated treatment of ESD, I/O, and process parameter interactions that both I/O designers and process designers can use. It examines key factors in I/O and ESD design and testing, and helps the reader consider ESD and reliability issues up front when making I/O choices. Emphasizing clarity and simplicity, this book focuses on design principles that can be applied widely as this dynamic field continues to evolve. Basic ESD and I/O Design:
* Describes strategies for design-oriented ESD protection
* Explains layout methods that enhance ESD protection designs
* Addresses basic I/O designs, including new problems such as mixed voltage interfaces
* Discusses fabrication aspects affecting ESD and I/O protection
* Illustrates concepts using numerous figures and examples
* Expresses device physics in terms of simple electrical circuit models
* Cross-references the material to standard texts in the field
Essential for engineers in industry and anyone designing circuits, systems, or devices for future technologies, Basic ESD and I/O Design is also a useful reference for researchers and graduate students involved in core VLSI design or computer architecture.
The first comprehensive guide to ESD protection and I/O design
Basic ESD and I/O Design is the first book devoted to ESD (electrostatic discharge) protection and input/output design. Addressing the growing demand in industry for high-speed I/O designs, it bridges the gap between ESD research and current VLSI design practices and provides a much-needed reference for practicing engineers who are frequently called upon to learn the subject on the job.
This volume presents an integrated treatment of ESD, I/O, and process parameter interactions that both I/O designers and process designers can use. It examines key factors in I/O and ESD design and testing, and helps the reader consider ESD and reliability issues up front when making I/O choices. Emphasizing clarity and simplicity, this book focuses on design principles that can be applied widely as this dynamic field continues to evolve. Basic ESD and I/O Design:
* Describes strategies for design-oriented ESD protection
* Explains layout methods that enhance ESD protection designs
* Addresses basic I/O designs, including new problems such as mixed voltage interfaces
* Discusses fabrication aspects affecting ESD and I/O protection
* Illustrates concepts using numerous figures and examples
* Expresses device physics in terms of simple electrical circuit models
* Cross-references the material to standard texts in the field
Essential for engineers in industry and anyone designing circuits, systems, or devices for future technologies, Basic ESD and I/O Design is also a useful reference for researchers and graduate students involved in core VLSI design or computer architecture.
SANJAY DABRAL received his PhD in electrical engineering from Rensselaer Polytechnic Institute. An independent consultant, he is also involved in developing high-speed I/O buses. TIMOTHY J. MALONEY has degrees in physics and electrical engineering from MIT and Cornell University. He is a Principal Engineer at Intel Corporation and has won the Intel Achievement Award for his patented ESD protection devices. A Senior Member of the IEEE, he has several patents issued and several more pending.
ESD Protection Methodology.
Additional ESD Considerations.
Circuits.
Layout Issues.
ESD and I/O Interactions.
Mixed-Voltage ESD.
ESD Reliability Measurement and Failure Analysis Basics.
Conclusion.
Index.
| Erscheint lt. Verlag | 5.1.1999 |
|---|---|
| Sprache | englisch |
| Maße | 160 x 244 mm |
| Gewicht | 573 g |
| Themenwelt | Mathematik / Informatik ► Informatik ► Theorie / Studium |
| Technik ► Elektrotechnik / Energietechnik | |
| ISBN-10 | 0-471-25359-6 / 0471253596 |
| ISBN-13 | 978-0-471-25359-4 / 9780471253594 |
| Zustand | Neuware |
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