Process Variations and Probabilistic Integrated Circuit Design

Manfred Dietrich, Joachim Haase (Herausgeber)

Buch | Softcover

252 Seiten

2014
Springer-Verlag New York Inc.
978-1-4899-8860-7 (ISBN)

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Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.
This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

Introduction.- Physical and Mathematical Fundamentals.- Examination of Process Parameter Variations.- Methods of Parameter Variations.- Consequences for Circuits Design and Case Studies.- Conclusion.

Zusatzinfo	XVI, 252 p.
Verlagsort	New York
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Informatik ► Weitere Themen ► CAD-Programme
Themenwelt	Technik ► Elektrotechnik / Energietechnik
Schlagworte	Embedded Systems
ISBN-10	1-4899-8860-2 / 1489988602
ISBN-13	978-1-4899-8860-7 / 9781489988607
Zustand	Neuware