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VLSI Design and Test

17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, D. Boolchandani, Virendra Sing, Adit Singh (Herausgeber)

Buch | Softcover

XVI, 388 Seiten

2013 | 2013
Springer Berlin (Verlag)
978-3-642-42023-8 (ISBN)

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This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

VLSI design.- Testing and verification.- Embedded systems.- Emerging technology.

Erscheint lt. Verlag	10.12.2013
Reihe/Serie	Communications in Computer and Information Science
Zusatzinfo	XVI, 388 p. 246 illus.
Verlagsort	Berlin
Sprache	englisch
Maße	155 x 235 mm
Gewicht	609 g
Themenwelt	Mathematik / Informatik ► Informatik ► Netzwerke
	Mathematik / Informatik ► Informatik ► Theorie / Studium
	Informatik ► Weitere Themen ► Hardware
Schlagworte	Digital Circuits • multi-processor architectures • Network-on-Chip • SRAM arrays • VLSI
ISBN-10	3-642-42023-0 / 3642420230
ISBN-13	978-3-642-42023-8 / 9783642420238
Zustand	Neuware