Soft Errors in Modern Electronic Systems

Buch | Softcover

318 Seiten

2012
Springer-Verlag New York Inc.
978-1-4614-2689-9 (ISBN)

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This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques.

The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Soft Errors from Space to Ground: Historical Overview, Empirical Evidence, and Future Trends.- Radiation Induced Single-Event Effects: Physical Mechanisms and Classification.- JEDEC Standard on Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors.- Cell-Level Modelling and Simulation.- Circuit and System Level Modelling and Simulation.- Hardware Fault Injection.- Accelerated Radiation Testing for Space Applications.- Testing for Ground-Level Applications.- Soft Error Mitigation Techniques.- Convergence of Mitigation Techniques for Soft Errors and Other Reliability Issues and Power Aware Mitigation Techniques.- Software Level Soft-Error Mitigation Techniques.- System Level Soft-Error Mitigation Techniques.

Reihe/Serie	Frontiers in Electronic Testing ; 41
Zusatzinfo	XVIII, 318 p.
Verlagsort	New York, NY
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Mathematik / Informatik ► Informatik ► Theorie / Studium
	Informatik ► Weitere Themen ► Hardware
	Technik ► Elektrotechnik / Energietechnik
ISBN-10	1-4614-2689-8 / 1461426898
ISBN-13	978-1-4614-2689-9 / 9781461426899
Zustand	Neuware