CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Process-Aware SRAM Design and Test

Andrei Pavlov, Manoj Sachdev (Autoren)

Buch | Softcover

194 Seiten

2010 | Softcover reprint of hardcover 1st ed. 2008
Springer (Verlag)
978-90-481-7855-1 (ISBN)

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

Prof. Sachdev has authored several successful books with Springer

and Motivation.- SRAM Circuit Design and Operation.- SRAM Cell Stability: Definition, Modeling and Testing.- Traditional SRAM Fault Models and Test Practices.- Techniques for Detection of SRAM Cells with Stability Faults.- Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques.

Reihe/Serie	Frontiers in Electronic Testing ; 40
Zusatzinfo	XVI, 194 p.
Verlagsort	Dordrecht
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Mathematik / Informatik ► Informatik ► Theorie / Studium
	Informatik ► Weitere Themen ► Hardware
	Technik ► Elektrotechnik / Energietechnik
ISBN-10	90-481-7855-X / 904817855X
ISBN-13	978-90-481-7855-1 / 9789048178551
Zustand	Neuware