Progress in Materials Analysis
Springer Wien (Verlag)
978-3-211-81759-9 (ISBN)
Materials for the First Wall of Fusion Reactors and Their Analytical Characterization.- Application of Positron Annihilation to Metallic Alloys.- Applications of SIMS in Interdisciplinary Materials Characterization.- Quantitative Secondary Neutral Mass Spectrometry Analysis of Alloys and Oxide-Metal-Interfaces.- Surface Analysis of Metals with SIMS.- Characterization of Metallic Glasses by Ion and Electron Microprobes.- Quantitative Surface Analysis of CVD-Hard Material Coatings with SIMS.- ISS- and SIMS-Analysis of Thin Organic Layers on Metal Surfaces.- New Developments in Spatially Multidimensional Ion Microprobe Analysis.- Investigation of Grain Boundary Segregation in Iron-Base Alloys by Auger Electron Spectroscopy.- Characterization of Anodic Oxide Layers by Sputter Profiling with AES and XPS.- Investigations of Phosphate Coatings of Galvanized Steel Sheets by a Surface-Analytical Multi-Method Approach.- Surface- and Microanalytical Investigations of the Chemical Constitution of the Grain Boundary Phase in Dense Silicon Nitride.- Analysis of Reactively Ion Plated Titanium-Nitride Films.- Quantitative Surface Analysis Without Reference Samples.- Improved Methods of Quantitative Electron Probe Microanalysis of Carbon-?(?z) Compared to Other Methods.- Quantitative Electron Probe Microanalysis of Sputtered FeC Dry Lubrication Films.- Experimental and ZAF Correction Aspects of Carbon Analysis in Steels: Application to the Carburization of Irradiated Uranium-Plutonium Carbide Fuel Pin Claddings.- Quantitative Electron Probe Microanalysis of Borides in Aluminium.- Microprobe Measurements to Determine Phase Boundaries and Diffusion Paths in Ternary Phase Diagrams Taking a Cu-Ni-Al System as an Example.- Investigation of (Mo, W)C Mixed Carbides by Electron ProbeMicroanalysis and Kossel Technique.- X-Ray Emission Spectroscopy by Means of Electron-Microprobe for the Determination of the Density of States with Binary Amorphous Alloys.- X-Ray Excited Fluorescence Spectroscopy Within SEM for Trace Analysis.- STEM-EDX Measurements on Grain Boundary Phenomena of Sensitized Chrome-Nickel Steels.- Metallurgical Investigations of Microstructure and Behaviour of High-Alloyed Manganese-Chromium Austenitic Steels for Generator-Rotor Retaining Rings.- Analytical Electron Microscopy for Interface Characterization - Corrosion of Concrete.- Electron Microscope Characterization of Highest-Coercivity Magnetic Materials.- Multi-Element Preconcentration from Technical Alloys.- Application of the Levitation Melting Technique in the Investigations of Iron and Steel Making.
Erscheint lt. Verlag | 8.9.1983 |
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Reihe/Serie | Mikrochimica Acta Supplementa |
Zusatzinfo | XIII, 349 p. 72 illus. |
Verlagsort | Vienna |
Sprache | englisch |
Gewicht | 700 g |
Themenwelt | Mathematik / Informatik ► Informatik |
Naturwissenschaften ► Chemie ► Analytische Chemie | |
Technik ► Maschinenbau | |
Schlagworte | Aluminium • electron microscopy • Glass • iron • Mangan • Materials • materials characterization • metals • Microscopy • Nickel • Phosphat • spectroscopy • Titan • X-Ray |
ISBN-10 | 3-211-81759-X / 321181759X |
ISBN-13 | 978-3-211-81759-9 / 9783211817599 |
Zustand | Neuware |
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