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Design, Analysis and Test of Logic Circuits Under Uncertainty

Buch | Hardcover
124 Seiten
2012
Springer (Verlag)
978-90-481-9643-2 (ISBN)

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Design, Analysis and Test of Logic Circuits Under Uncertainty - Smita Krishnaswamy, Igor L. Markov, John P. Hayes
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Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques.
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.

Reihe/Serie Lecture Notes in Electrical Engineering ; 115
Zusatzinfo XII, 124 p.
Verlagsort Dordrecht
Sprache englisch
Maße 155 x 235 mm
Themenwelt Mathematik / Informatik Informatik Theorie / Studium
Technik Elektrotechnik / Energietechnik
ISBN-10 90-481-9643-4 / 9048196434
ISBN-13 978-90-481-9643-2 / 9789048196432
Zustand Neuware
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