Basics of Interferometry
Academic Press Inc (Verlag)
978-0-12-373589-8 (ISBN)
Optical interferometry is used in communications, medical imaging, astonomy, and structural measurement. With the use of an interferometer engineers and scientists are able to complete surface inspections of micromachined surfaces and semiconductors. Medical technicians are able to give more consise diagnoses with the employ of interferometers in microscopy, spectroscopy, and coherent tomography.
Originating from a one-day course, this material was expanded to serve as an introduction to the topic for engineers and scientists that have little optical knowledge but a need for more in their daily work lives. The need for interferometry knowledge has crossed the boundaries of engineering fields and Dr. Hariharan has written a book that answers the questions that new practitioners to interferometry have and haven't even thought of yet. Basics of Interferometry, Second Edition includes complete updates of all material with an emphasis on applications. It also has new chapters on white-light microsopy and interference with single photons.
Professor P. Hariharan is a Research Fellow in the Division of Telecommunications and Industrial Physics of CSIRO in Sydney and a Visiting Professor at the University of Sydney. His main research interests are interferometry and holography. He is a Fellow of SPIE (The International Society for Optical Engineering), the Optical Society of America (OSA), the Institute of Physics, London, and the Royal Photographic Society. He was a vice-president and then the treasurer of the International Commission of Optics, as well as a director of SPIE. Honors he has received include OSA’s Joseph Fraunhofer Award, the Henderson Medal of the Royal Photographic Society, the Thomas Young Medal of the Institute of Physics, London, SPIE’s Dennis Gabor Award and, most recently, SPIE’s highest award, the Gold Medal.
1. Introduction 2. Interference: A Primer 3. Two-Beam Interferometers 4. Source-Size and Spectral Effects 5. Multiple-Beam Interference 6. The Laser as a Light Source 7. Photodetectors 8. Measurements of Length 9. Optical Testing 10. Digital Techniques 11. Macro- and Micro-Interferometry 12. White-Light Interference Microscopy 13. Holographic and Speckle Interferometry 14. Interferometric Sensors 15. Interference Spectroscopy 16. Fourier-Transform Spectroscopy 17. Interference with Single Photons 18. Building an Interferometer
Appendix A. Monochromatic Light Waves B. Phase Shifts on Reflections C. Diffraction D. Polarized Light E. The Pancharatnam Phase F. The Twyman-Green Interferometer: Initial Adjustment G. The Mach-Zehnder Interferometer: Initial Adjustment
| Erscheint lt. Verlag | 3.11.2006 |
|---|---|
| Verlagsort | San Diego |
| Sprache | englisch |
| Maße | 152 x 229 mm |
| Gewicht | 520 g |
| Themenwelt | Technik |
| ISBN-10 | 0-12-373589-0 / 0123735890 |
| ISBN-13 | 978-0-12-373589-8 / 9780123735898 |
| Zustand | Neuware |
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