Electromagnetic Compatibility

Principles and Applications

Yang Zhao, Wei Yan, Jun Sun, Mengxia Zhou, Zhaojuan Meng (Autoren)

Buch | Hardcover

232 Seiten

2021 | 1st ed. 2021
Springer Verlag, Singapore
978-981-16-6451-9 (ISBN)

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This book highlights principles and applications of electromagnetic compatibility (EMC). After introducing the basic concepts, research progress, standardizations and limitations of EMC, the book puts emphasis on presenting the generation mechanisms and suppression principles of conducted electromagnetic interference (EMI) noise, radiated EMI noise, and electromagnetic susceptibility (EMS) problems such as electrostatic discharge (ESD), electric fast transient (EFT) and surge. By showing EMC case studies and solved examples, the book provides effective solutions to practical engineering problems. Students and researchers will be able to use the book as practical reference for EMC-related measurements and problem- solution.

Dr. Yang ZHAO is Professor at School of Electrical & Automation Engineering, Nanjing Normal University, and Director of Jiangsu Engineering Key Laboratory of Electrical Equipment and Electromagnetic Compatibility. He is mainly engaged in research and applications of electromagnetic compatibility, electronical engineering, and electric science and technology. Dr. Wei YAN is Associate Professor at School of Electrical & Automation Engineering, Nanjing Normal University. Dr. Zhaojuan MENG is Associate Dean at School of Electrical & Automation Engineering, Nanjing Normal University.

Chapter 1,Summary of electromagnetic compatibility.- Chapter 2. Conducted EMI noise generated mechanism, measurement and diagnosis.- Chapter 3. Conducted electromagnetic interference suppression methods and case studies.- Chapter 4. Radiated EMI noise generated mechanism, measurement and diagnosis.- Chapter 5. Radiated electromagnetic interference suppression methods and case study.- Chapter 6. Principle and analysis of electromagnetic susceptibility.- Chapter 7. Case study of electromagnetic susceptibility

Erscheinungsdatum	29.12.2021
Zusatzinfo	82 Illustrations, color; 149 Illustrations, black and white; IX, 232 p. 231 illus., 82 illus. in color.
Verlagsort	Singapore
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Elektrodynamik
	Naturwissenschaften ► Physik / Astronomie ► Optik
	Technik ► Elektrotechnik / Energietechnik
Schlagworte	Conducted EMI Noise (CE) • Elecromagnetic Susceptibility (EMS) • Electrical Fast Transient (EFT) • Electrical Static Discharge (ESD) • Electromagnetic Interference (EMI) • Engineering application • Engineering Case Study • Radiated EMI Noise (RE) • Suppression Method
ISBN-10	981-16-6451-X / 981166451X
ISBN-13	978-981-16-6451-9 / 9789811664519
Zustand	Neuware