Investigations on rf breakdown phenomenon in high gradient accelerating structures

Jiahang Shao (Autor)

Buch | Hardcover

131 Seiten

2018 | 1st ed. 2018
Springer Verlag, Singapore
978-981-10-7925-2 (ISBN)

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This book mainly focuses on the experimental research of rf breakdown and field emission with novel methods, including triggering rf breakdown with high intensity laser and pin-shaped cathodes as well as locating field emitters with a high resolution in-situ imaging system. With these methods, this book has analyzed the power flow between cells during rf breakdown, observed the evolution of field emission during rf conditioning and the dependence of field emission on stored energy, and studied the field emitter distribution and origination. The research findings greatly expand the understanding of rf breakdown and field emission, which will in turn benefit future study into electron sources, particle accelerators, and high gradient rf devices in general.

Jiahang Shao received his Bachelor’s degree in Engineering from the Department of Electronic Engineering at Tsinghua University, China in 2011. He obtained his Ph.D. in Engineering from the Department of Engineering Physics at the same university in July 2016, where his major research project in Prof. Huaibi Chen’s group was the experimental study of rf breakdown and field emission in high gradient accelerating structures. Currently, he is a postdoctoral appointee working with Prof. Wei Gai at Argonne National Laboratory, USA, continuing his study on field emission and conducting research on wakefield generation by intense electron beam.

Introduction.- Experimental research of laser triggered rf breakdown.- Experimental research of pin cathode.- In-situ high resolution field emission imaging.- Summary and Fulture study.- Appendix A: The calculation of the electric field on the pin cathode surface Resume and publications.

Erscheinungsdatum	08.02.2018
Reihe/Serie	Springer Theses
Zusatzinfo	111 Illustrations, color; 18 Illustrations, black and white; XIV, 131 p. 129 illus., 111 illus. in color.
Verlagsort	Singapore
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
	Naturwissenschaften ► Physik / Astronomie ► Hochenergiephysik / Teilchenphysik
	Technik ► Elektrotechnik / Energietechnik
Schlagworte	Field emission on stored energy • High gradient accelerating structures • Photocathode RF gun • RF breakdown phenomenon • RF conditioning process
ISBN-10	981-10-7925-0 / 9811079250
ISBN-13	978-981-10-7925-2 / 9789811079252
Zustand	Neuware