Introduction to Optical Metrology

Rajpal S. Sirohi (Autor)

Buch | Hardcover

449 Seiten

2015
Crc Press Inc (Verlag)
978-1-4822-3610-1 (ISBN)

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Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text:

Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy
Describes the different principles used to measure the refractive indices of solids, liquids, and gases
Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length
Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements
Depicts a wave propagating in the positive z-direction by ei(ωt – kz), as opposed to ei(kz – ωt)

Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.

Rajpal S. Sirohi, Ph.D, is currently chair professor of the Physics Department at Tezpur University, India, and senior editor of Optical Engineering. Previously, he was director of the Indian Institute of Technology Delhi; vice-chancellor of Barkatullah University, Bhopal; vice-chancellor of Shobhit University, Meerut; and vice-chancellor of Amity University, Jaipur. He also served in various capacities at the Indian Institute of Science, Bangalore; Indian Institute of Technology Madras, Chennai; Case Western Reserve University, Cleveland, Ohio, USA; Rose-Hulman Institute of Technology, Terre Haute, Indiana, USA; Institute for Advanced Studies, University of Malaya, Malaysia; University of Namibia; National University of Singapore; and École Polytechnique Fédérale de Lausanne, Switzerland. Widely published and highly decorated, Professor Sirohi is or has been a fellow, honorary fellow, invited fellow, member, board member, and former president of numerous scientific academies, associations, committees, societies, and journals.

Introduction to Optics. Laser Beams. Sources, Detectors, and Recording Media. Interferometry. Techniques. Measurement of Refractive Index. Measurement of Radius of Curvature and Focal Length. Optical Testing. Angle Measurement. Thickness Measurement. Measurement of Velocity. Pressure Measurement. Fiber Optic- and MEM-Based Measurements. Length Measurement.

Reihe/Serie	Optical Sciences and Applications of Light
Zusatzinfo	16 Tables, black and white; 284 Illustrations, black and white
Verlagsort	Bosa Roca
Sprache	englisch
Maße	156 x 234 mm
Gewicht	990 g
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Optik
Themenwelt	Technik ► Maschinenbau
ISBN-10	1-4822-3610-9 / 1482236109
ISBN-13	978-1-4822-3610-1 / 9781482236101
Zustand	Neuware