Troubleshooting on Microprocessor Based Systems (eBook)

G. B. Williams (Autor)

D.W. Hopkins (Herausgeber)

eBook Download: PDF

2013 | 1. Auflage
233 Seiten
Elsevier Science (Verlag)
978-1-4832-9340-0 (ISBN)

Infos

The structure of a computing system presents unique problems when it fails to operate correctly and requires testing. This concise, yet comprehensive book describes the major test methods in current use, and their development from basic principles. Examines the sequence of tests which, built on each other, provide a suitable vehicle for testing digital systems, and the various types of testing equipment that should be applied for specific tests. An excellent introduction for those entering this increasingly complex world, the text will provide the reader with a firm basis on which to judge future development.

Inhalt

Front Cover 1
Troubleshooting on Microprocessor Based Systems 4
Copyright Page 5
Table of Contents 16
Chapter 1. INTRODUCTION TO MICROPROCESSOR BASED SYSTEMS 20
1.1 The Digital Computer 21
1.2 Bus Structured Systems 22
1.3 Memory Mapped Systems 25
1.4 Tri-state Devices 26
1.5 Address Decoding 28
1.6 A Microcontroller 35
1.7 Programming Levels 37
Chapter 2. SYSTEM TESTING PROBLEMS 43
2.1 Hardware or Software? 44
2.2 Time Sequential, Bit Parallel Data 44
2.3 Bus Multiplexing 45
2.4 The Device Testing Problem 45
2.5 The System Kernel 47
2.6 CPU Testing 49
2.7 ROM Testing 49
2.8 RAM Testing 52
2.9 Input/Output Testing 55
2.10 Some Common System Problems 56
Chapter 3. SYSTEM TESTING PHILOSOPHY 69
3.1 Self-test Programs 71
3.2 Is There Really a Fault? 72
3.3 The Life-cycle of an Integrated Circuit 74
3.4 Stress Testing 75
3.5 Isolation Techniques 77
3.6 The Troubleshooting Tree 80
Chapter 4. THE USE OF CONVENTIONAL TEST EQUIPMENT 84
4.1 Multimeters 84
4.2 Frequency Counters 85
4.3 The Oscilloscope 86
4.4 The Limitations of Conventional Test Equipment 90
Chapter 5. HAND-HELD TOOLS 92
5.1 Logic Probes 93
5.2 Logic Pulsers 101
5.3 Stimulus-response Testing Using a Pulser and Probe 105
5.4 The Current Tracer 106
5.5 Logic Comparators 114
5.6 The Limitations of Hand-held Tools 115
Chapter 6. LOGIC ANALYSERS 117
6.1 Logic State Analysers 119
6.2 Logic Timing Analysers 130
6.3 Display Modes 133
6.4 Logic Analyser Features 141
Chapter 7. SIGNATURE ANALYSERS 150
7.1 The Nature of Digital Waveforms 151
7.2 Transition Counting 152
7.3 The Probability of Success Using the Transition Counting Technique 153
7.4 Cyclic Redundancy Check Codes 157
7.5 Signature Analysis 159
7.6 The Probability of Success Using Signature Analysis 162
7.7 A Simple Signature Analyser 168
7.8 Free-run Testing Using a Signature Analyser 172
7.9 ROM Testing During Free-run 176
7.10 Signature Analysis Test Loops 177
7.11 Retrofitting Signature Analysis 178
7.12 Limitations of Signature Analysis 179
7.13 Signature Analysis as a General Test Technique 180
Chapter 8. EMULATION 182
8.1 Development Systems 183
8.2 System Testing Using a Development System 194
8.3 Stand-alone Emulators 195
Chapter 9. SELF-TEST AND DIAGNOSTIC SOFTWARE 198
9.1 Self-test Routines 199
9.2 Diagnostic Tests 204
Chapter 10. TESTING PERIPHERAL RELATED FUNCTIONS 208
10.1 An Example of Sub-system Functional Testing 209
10.2 Testing Serial Data Communication Lines 211
10.3 Monitoring the IEEE-488 Instrumentation Bus 221
REFERENCES 229
INDEX 230

Produkt-Details

• Erscheint lt. Verlag: 22.10.2013
• Sprache: englisch
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Themenwelt: Technik ► Maschinenbau
• ISBN-10: 1-4832-9340-8 / 1483293408
• ISBN-13: 978-1-4832-9340-0 / 9781483293400