International Conference on Microelectronic Test Structures

Institute of Electrical and Electronics Engineers (Autor)

Buch | Softcover

313 Seiten

1997
I.E.E.E.Press (Verlag)
978-0-7803-2783-2 (ISBN)

Infos

This international conference covers advances in recent developments and future directions on all microelectronic test structures and their applications for characterisation of device matching, critical dimension, parameter extraction, yield reliability, and interconnection.

Produkt-Details

• Erscheint lt. Verlag: 1.1.1997
• Verlagsort: Piscataway NJ
• Sprache: englisch
• Maße: 216 x 298 mm
• Gewicht: 953 g
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• ISBN-10: 0-7803-2783-7 / 0780327837
• ISBN-13: 978-0-7803-2783-2 / 9780780327832
• Zustand: Neuware