Advances in Imaging and Electron Physics

Buch | Hardcover

451 Seiten

2001
Academic Press Inc (Verlag)
978-0-12-014758-8 (ISBN)

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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Chapter I: Basic Field Equations

Chapter II: Reducible Systems

Chapter III: Basic Mathematical Tools

Chapter IV: The Finite-Difference Method (FDM)

Chapter V: The Finite-Element Method (FEM)

Chapter VI: The Boundary Element Method

Chapter VII: Hybrid Methods

Appendix

Index

Erscheint lt. Verlag	5.7.2001
Reihe/Serie	Advances in Imaging and Electron Physics
Verlagsort	San Diego
Sprache	englisch
Maße	152 x 229 mm
Gewicht	810 g
Themenwelt	Technik ► Elektrotechnik / Energietechnik
ISBN-10	0-12-014758-0 / 0120147580
ISBN-13	978-0-12-014758-8 / 9780120147588
Zustand	Neuware