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Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Buch | Hardcover
410 Seiten
2013
Academic Press Inc (Verlag)
978-0-12-407700-3 (ISBN)
CHF 259,95 inkl. MwSt
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Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Invariant Quantum Wave Equations and Double Space-TimeClaude Daviau
In-Situ and Correlative Electron MicroscopyNiels de Jonge
Electron Tweezers as a Tool for High Precision Manipulation of NanoobjectsVladimir P. Oleshko and James M. Howe
Robustness Analysis of the Reduced Fuzzy Texture Spectrum and its Performance on Noisy ImagesPilar Sobrevilla , Eduard Montseny, and Aina Barcelo
Measure-by-Wire: An Automatic Control Framework for High-Throughput Transmission Electron MicroscopyArturo Tejada, Wouter Van den Broek, and Arnold J. den Dekker

Reihe/Serie Advances in Imaging and Electron Physics
Mitarbeit Herausgeber (Serie): Peter W. Hawkes
Verlagsort San Diego
Sprache englisch
Maße 152 x 229 mm
Gewicht 700 g
Themenwelt Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Naturwissenschaften Physik / Astronomie Optik
Technik
ISBN-10 0-12-407700-5 / 0124077005
ISBN-13 978-0-12-407700-3 / 9780124077003
Zustand Neuware
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