CdTe and Related Compounds; Physics, Defects, Hetero- and Nano-structures, Crystal Growth, Surfaces and Applications

Physics, CdTe-based Nanostructures, CdTe-based Semimagnetic Semiconductors, Defects

Robert Triboulet, Paul Siffert (Herausgeber)

Buch | Hardcover

550 Seiten

2009
Elsevier Science Ltd (Verlag)
978-0-08-046409-1 (ISBN)

Artikel merken

A monograph that deals with two very topical II-VI semiconductor compounds, CdTe and CdZnTe, covering their modern and fundamental aspects. It features coverage of the main topics associated with the very topical II-VI semiconductor compound CdTe and its alloy CZT as well as review of the CdTe developments.

Almost thirty years after the remarkable monograph of K. Zanio and the numerous conferences and articles dedicated since that time to CdTe and CdZnTe, after all the significant progresses in that field and the increasing interest in these materials for several extremely attractive industrial applications, such as nuclear detectors and solar cells, the edition of a new enriched and updated monograph dedicated to these two very topical II-VI semiconductor compounds, covering all their most prominent, modern and fundamental aspects, seemed very relevant and useful.

Introduction (J.B. Mullin) CdTe-based materials: Band Structures and Binding Properties (Arden Sher) Optical phonon spectra in CdTe crystals and ternary alloys of CdTe compounds (B.N.Mavrin, E.A.Vinogradov) Band structure and Electrical Properties (C.R. Becker) The Optical Properties of CdTe (V. Consonni) Mechanical Properties of CdTe and Alloys (J.C. Moosbrugger) CdTe-based nanostructures (H. Mariette) CdTe-based semimagnetic semiconductors (R.R. Galazka and T. Wojtowicz) Macroscopic defects (K. Durose) Inclusions and precipitates in CdZnTe substrates (J.-O. Ndap) Theoretical calculation of the formation energies of point defects and of their energetic levels in CdTe (M.A. Berding) Experimental identification of intrinsic point defects; Characterization of intrinsic defects levels in CdTe and CdZnTe (K. Lynn) Experimental identification of native point defects in CdTe (P. Fochuk and O. Panchuk) Doping (O. Panchuk) Impurity compensation (Y. Marfaing)

Reihe/Serie	European Materials Research Society Series
Verlagsort	Oxford
Sprache	englisch
Maße	152 x 229 mm
Gewicht	810 g
Themenwelt	Technik ► Maschinenbau
ISBN-10	0-08-046409-2 / 0080464092
ISBN-13	978-0-08-046409-1 / 9780080464091
Zustand	Neuware