Molecular Beam Epitaxy
Fundamentals and Current Status
Seiten
1996
|
2., rev. and updated ed.
Springer Berlin (Hersteller)
978-3-540-60594-2 (ISBN)
Springer Berlin (Hersteller)
978-3-540-60594-2 (ISBN)
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The second discusses the physico-chemical aspects of the crystallization processes of different materials (mainly semi conductors) and device structures. The third part describes the characterization methods which link the physical properties of the grown film or structures with the technological parameters of the crystallization procedure. Latest achievements in the field are emphasized, such as solid source MBE, including silicon MBE, gas source MBE, especially metalorganic MBE, phase-locked epitaxy and atomic-layer epitaxy, photoassisted molecular layer epitaxy and migration enhanced epitaxy.
This study describes a technique in wide-spread use for the production of high-quality semiconductor devices. It discusses the most important aspects of the MBE apparatus, the physics and chemistry of the crystallization of various materials and device structures, and the characterization methods that relate the structural parameters of the grown (or growing) film or structure to the technologically relevant procedure. In this edition two new fields have been added: crystallization of as-grown low-dimensional heterostructures, mainly quantum wires and quantum dots and in-growth control of the MBE crystallization process of strained-layer structures.
discusses the more important problems concerning MBE equipment.
| Reihe/Serie | Springer Series in Materials Science ; 7 |
|---|---|
| Zusatzinfo | 260 figs., 25 in color |
| Sprache | englisch |
| Gewicht | 840 g |
| Einbandart | gebunden |
| Schlagworte | Halbleiter |
| ISBN-10 | 3-540-60594-0 / 3540605940 |
| ISBN-13 | 978-3-540-60594-2 / 9783540605942 |
| Zustand | Neuware |
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