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Speckle Metrology - R.S. Sirohi

Speckle Metrology

(Autor)

Buch | Hardcover
572 Seiten
1993
Crc Press Inc (Verlag)
978-0-8247-8932-9 (ISBN)
CHF 649,95 inkl. MwSt
Covers speckle metrology and its value as a measuring technique in industry. This book also surveys the origin of speckle displacement and decorrelation, presents procedures for deformation analysis and shape measurement of rough objects, and explains particle image velocimetry (PIV).
This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.

R. S Sirohi (Author)

Theory and applications of speckle displacement and decorrelation, I. Yamaguchi; techniques of displacement and deformation measurements in speckle metrology, Pramod K. Rastogi; speckle methods in experimental mechanics, Rajpal S. Sirohi; recent developments in video speckle interferometry, Ole J. Lokberg; novel applications of speckle metrology, Chandra S. Vikram; particle image velocimetry (PIV), K.D. Hinsch; white light speckle metrology, Anand K. Asundi; surface roughness evaluation, J.D. Briers; automatic fringe analysis procedures in speckle metrology, G.H. Kaufmann; speckle metrology using hololenses, Chandra Shahker; correlation speckle interferometry in the mechanics of contact interaction, Yu I. Ostrovsky and V.P. Shchepinov.

Erscheint lt. Verlag 20.5.1993
Reihe/Serie Optical Science and Engineering
Verlagsort Bosa Roca
Sprache englisch
Maße 152 x 229 mm
Gewicht 861 g
Themenwelt Naturwissenschaften Physik / Astronomie Optik
Technik Maschinenbau
ISBN-10 0-8247-8932-6 / 0824789326
ISBN-13 978-0-8247-8932-9 / 9780824789329
Zustand Neuware
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