Scanning Tunneling Microscopy and Spectroscopy
Seiten
1993
John Wiley & Sons Inc (Verlag)
978-0-471-18735-6 (ISBN)
John Wiley & Sons Inc (Verlag)
978-0-471-18735-6 (ISBN)
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Scanning tunneling microscopy (STM) provides three-dimensional real- space images of surfaces at high spatial resolution. When the surface is flat and clean, even atoms can be imaged. Its extreme usefulness has led it to near instantaneous acceptance as a characterization tool. This book covers fundamental concepts of STM operation, image interpretation, instrumentation, and techniques for various applications. It als contains advanced treatments of theory and spectroscopy. Surface physicists, electrochemists, materials scientists, and other scientists who see a use for STM will find the depth of coverage and accompanying reference lists in this book essential to their work. In addition, those who wish to add the capabilities of probe microscopy to their operations, such as microscopists and quality control engineers, will find the basic information in this book.
Microscope Design and Operation. Theory of Scanning Tunneling Microscopy. Methods of Tunneling Spectroscopy with the STM. The Surface Structure of Crystalline Solids. The Preparation of Tip and Sample Surfaces for STM Experiments. Force Microscopy. BEEM and the Characterization of Buried Interfaces. Applications in Electrochemistry. Biological Applications of the Scanning Probe Microscope.
| Erscheint lt. Verlag | 3.1.2001 |
|---|---|
| Verlagsort | New York |
| Sprache | englisch |
| Maße | 61 x 92 mm |
| Gewicht | 822 g |
| Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
| ISBN-10 | 0-471-18735-6 / 0471187356 |
| ISBN-13 | 978-0-471-18735-6 / 9780471187356 |
| Zustand | Neuware |
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