Modern Developments and Applications in Microbeam Analysis

Glyn Love, W.A.Patrick Nicholson, Aldo Armigliato (Herausgeber)

Buch | Softcover

XI, 392 Seiten

1998 | 1. Softcover reprint of the original 1st ed. 1998
Springer Wien (Verlag)
978-3-211-83106-9 (ISBN)

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This supplement of Mikrochimica Acta contains selected papers from the Fifth Workshop of the European Microbeam Analysis Society (EMAS) on "Modern Developments and Applications in Microbeam Analysis" which th th took place from the 11 to 15 May 1997 in Torquay (UK). EMAS was founded in 1986 by scientists from many European countries in order to stimulate research in microbe am analysis and into its development and application. The society now has over 350 members from more than 20 countries. An important EMAS activity is the organisation of biennial workshops which focus upon the current status and developing trends in microanalytical techniques. For this meeting EMAS chose to invite speakers on the following subjects: Standardless analysis, EPMA techniques for quantitative near-surface analysis and depth profiling, Matrix corrections in Auger electron and X-ray photon spectroscopy, X-ray analysis and imaging using low voltage beams, Scanning probe and near field microscopies, EPMA of frozen biological bulk samples, Environmen tal SEM and X-ray microanalysis of biological materials, Quantitative elemental mapping of X-ray radiographs by factorial correspondence, X-ray spectrum processing and multivariate analysis, Thin film analysis and chemical mapping in the analytical electron microscope, Wavelength dispersive X-ray spectroscopy, High resolution non dispersive X-ray spectroscopy with state-of-the-art silicon detectors and Recent developments in instrumentation for X-ray analysis. These invited lectures were given by eminent scientists from Europe, the USA, and Australia In addition to the introductory lectures there were poster sessions at which some 110 posters were on display.

Recent Developments in Instrumentation for X-Ray Microanalysis.- High Resolution Non Dispersive X-Ray Spectroscopy with State of the Art Silicon Detectors.- Efficiency Calibration of a Si(Li) Detector by EPMA.- Wavelength-Dispersive X-Ray Spectrometry.- X-Ray Spectrum Processing and Multivariate Analysis.- Thin Film Analysis and Chemical Mapping in the Analytical Electron Microscope.- On the Spatial Resolution in Analytical Electron Microscopy.- Contamination in Analytical Electron Microscopy and in ALCHEMI.- Analytical Electron Microscopy of Diffusional Interfaces in an Al-22 at. % Zn Alloy.- Quantitative TEM-EDXS of Sol-Gel Derived PZT Ceramic Materials.- Particulate Composites of TZP-Chromium Oxide and TZP-Chromium Carbide; Microbeam Investigations.- Cryo-Electron Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Energy-Dispersive X-Ray Analysis of Ag(Br, I) Nano- and Microcrystals.- Electron Energy-Loss Near-Edge Structure of Alumina Polymorphs.- SPM Study of YBCO Films Prepared by Plasma Assisted Laser Ablation.- Surface Characterisation and Modification of YBCO Thin Films by STM.- Quantitative Near-Surface Microanalysis and Depth Profiling by EPMA.- EPMA Sputter Depth Profiling, Part I: Theory and Evaluation.- EPMA Sputter Depth Profiling, Part II: Experiment.- Quantitative Analysis of BN (C, O, Ar, H)-Coatings Using EPMA and SIMS.- Quantitative EDS Analysis of SiO2/Al2O3/TiO2 Multilayer Films.- Surface Ionization of Thin Films on Substrates: Measurement and Simulation.- Comparison of Different Methods to Characterize Thin a-Si:H Films.- EPMA Studies of the Growth of Thin Surface Coatings Produced by Evaporation.- Analysis of Thin Films with Slightly Rough Boundaries.- Effect of Chromium Substrate Pretreatment on Diamond Growth by the Chemical Vapour Deposition Method.- EPMA Determination of Arsenic Excess in Low Temperature Grown GaAs.- EPMA of Melted UO2 Fuel Rods from the Phebus-FP Reactor Accident Experiment.- Steels, Carbon Concentration, and Microhardness.- Determination of Chemical and Phase Composition of Fly-Ashes by Combined EPMA and XRD Methods.- EPMA of the Composition of Opal-Based Nanostructured Materials.- NDIC and EMP Study of Plagioclase Mineral Zoning: An Example from Nea Kameni Lavas.- Compositional X-Ray Maps of Metamorphic and Magmatic Minerals.- Chemical Mapping of Weathering Stages in Laterites.- Electron Microprobe Determination of Minor and Trace Concentrations of Gold and Platinum Group Elements in Sulphides and Sulpharsenides: Problems, Solutions, and Applications.- Composition of 15-17th Century Archaeological Glass Vessels Excavated in Antwerp, Belgium.- Potassium Migration in Silica Glass During Electron Beam Irradiation.- X-Ray Microanalysis of Frozen-Hydrated Biological Bulk Samples.- Environmental SEM and X-Ray Microanalysis of Biological Materials.- Effects of Electron-Beam/Gas Interactions on X-Ray Microanalysis in the Variable Pressure SEM.- The Analytical Signal in EPMA and the Influence of the Electric Field Created by the Primary Beam.- Standardless Analysis.- A New Technique for Standardless Analysis by EPMA-TWIX.- Stopping Power Factor for Standardless QEPMA.- On the Measurement of the Backscattering Coefficient for Low Energy Electrons.- Monte Carlo Simulations of Edge Artefacts in MULSAM Images.- Assessment of the Inelastic Scattering Model in Monte-Carlo Simulations.- A Rapid Comparison of Matrix Corrections in AES and XPS by Means of Computer Programs.- Fractals and BaTiO3-Ceramic Microstructure Analysis.- Fragmentation of Sputtered Cluster Ions of Transition Metals:Distributions of Lifetimes and Internal Energies.- Sputtering of Tantalum by Atomic and Molecular Gold Ions: Comparative Study of Yields and Kinetic Energy Distributions of Atomic and Cluster Ions.- The Standards, Measurements and Testing Programme (SMT), the European Support to Standardisation, Measurements and Testing Projects.

Erscheint lt. Verlag	20.7.1998
Reihe/Serie	Mikrochimica Acta Supplementa
Zusatzinfo	XI, 392 p.
Verlagsort	Vienna
Sprache	englisch
Maße	193 x 260 mm
Gewicht	1087 g
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
Themenwelt	Technik ► Maschinenbau
Schlagworte	Calibration • Ceramics • electron microscopy • Elektronenmikroskopie • Glass • Materials Science • metals • Microscopy • Oberflächenbehandlung • Röntgenspektrometrie • spectroscopy • X-Ray
ISBN-10	3-211-83106-1 / 3211831061
ISBN-13	978-3-211-83106-9 / 9783211831069
Zustand	Neuware