Advances in Imaging and Electron Physics
Seiten
2002
Academic Press Inc (Verlag)
978-0-12-014767-0 (ISBN)
Academic Press Inc (Verlag)
978-0-12-014767-0 (ISBN)
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Merges two serials - "Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, as well as the computing methods used in these domains.
"Advances in Imaging and Electron Physics" merges two long-running serials - "Advances in Electronics and Electron Physics" and "Advances in Optical & Electron Microscopy". It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
"Advances in Imaging and Electron Physics" merges two long-running serials - "Advances in Electronics and Electron Physics" and "Advances in Optical & Electron Microscopy". It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
| Erscheint lt. Verlag | 4.1.2003 |
|---|---|
| Verlagsort | San Diego |
| Sprache | englisch |
| Maße | 152 x 229 mm |
| Gewicht | 760 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
| ISBN-10 | 0-12-014767-X / 012014767X |
| ISBN-13 | 978-0-12-014767-0 / 9780120147670 |
| Zustand | Neuware |
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