IEEE International Reliability Physics Symposium
2002
I.E.E.E.Press (Hersteller)
978-0-7803-7353-2 (ISBN)
I.E.E.E.Press (Hersteller)
978-0-7803-7353-2 (ISBN)
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This CD-ROM originates from the 2002 IEEE International Reliability Physics Symposium, and is concerned with electron devices. Its contents include: non volatile memory; dielectrics; hot carriers; assembly/packaging; device dielectrics; interconnects; product reliability; and device and process.
Non Volatile Memory; Dielectrics; Hot Carriers; Assembly/Packaging; Device Dielectrics; Device & Process; Interconnects; Non Volatile Memory; Product Reliability; Compound Semiconductor Failure Analysis
| Erscheint lt. Verlag | 31.5.2002 |
|---|---|
| Verlagsort | Piscataway NJ |
| Sprache | englisch |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Angewandte Physik |
| Technik ► Elektrotechnik / Energietechnik | |
| ISBN-10 | 0-7803-7353-7 / 0780373537 |
| ISBN-13 | 978-0-7803-7353-2 / 9780780373532 |
| Zustand | Neuware |
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