Neutral Atom Imaging Using a Pulsed Electromagnetic Lens
Seiten
2017
|
1st ed. 2018
Springer International Publishing (Verlag)
978-3-319-68429-1 (ISBN)
Springer International Publishing (Verlag)
978-3-319-68429-1 (ISBN)
This book describes the design, construction, and characterization of a new type of aberration-corrected, neutral-atom lens. Atom beam control plays a crucial role in many different fields, ranging from fundamental physics research and materials science to applied nanotechnology. Despite this, atom-optical elements like lenses and mirrors remain relatively underdeveloped compared to their counterparts in other optics fields. Although aberration correction is addressed quite comprehensively in photon and electron lenses, no credible research efforts have yet produced the same technology for neutral atoms.
It reports on progress towards a neutral atom imaging device that will be useful in a range of applications, including nanofabrication and surface microscopy. It presents a novel technique for improving refractive power and correcting chromatic aberration in atom lenses based on a fundamental paradigm shift from continuous, two-dimensional focusing to a pulsed, three-dimensional approach. Simulations of this system suggest that it will pave the way towards the long-sought goal of true atom imaging on the nanoscale. The book further describes the construction of a prototype lens, and shows that all of the technological requirements for the proposed system are easily satisfied. Using metastable neon from a supersonic source, the prototype was characterized for three different focal lengths and a diverse range of apertures. Despite some manufacturing imperfections, lower distortion and higher resolution than has been shown in any previous hexapole lens was observed. Comparison with simulations corroborates the underlying theory and encourages further refinement of the process.
It reports on progress towards a neutral atom imaging device that will be useful in a range of applications, including nanofabrication and surface microscopy. It presents a novel technique for improving refractive power and correcting chromatic aberration in atom lenses based on a fundamental paradigm shift from continuous, two-dimensional focusing to a pulsed, three-dimensional approach. Simulations of this system suggest that it will pave the way towards the long-sought goal of true atom imaging on the nanoscale. The book further describes the construction of a prototype lens, and shows that all of the technological requirements for the proposed system are easily satisfied. Using metastable neon from a supersonic source, the prototype was characterized for three different focal lengths and a diverse range of apertures. Despite some manufacturing imperfections, lower distortion and higher resolution than has been shown in any previous hexapole lens was observed. Comparison with simulations corroborates the underlying theory and encourages further refinement of the process.
Dr. Jamie Gardner received a Ph.D. from the University of Texas at Austin in 2016.
Introduction.- Supersonic beams.- Cooling and pumping.- Atoms in a magnetic field.- Magnetic mirror.- Lens design.- Experimental setup.- Results.- Conclusion.
| Erscheinungsdatum | 23.11.2017 |
|---|---|
| Reihe/Serie | Springer Theses |
| Zusatzinfo | XVI, 112 p. 97 illus., 64 illus. in color. |
| Verlagsort | Cham |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Gewicht | 364 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
| Naturwissenschaften ► Physik / Astronomie ► Plasmaphysik | |
| Schlagworte | Applied Optics • atom lithography • Atoms and Molecules in Strong Fields, Laser Matter • magnetic mirror • metastable-atom microscope • nanoscale science and technology • nanotechnology • neutral atom focusing • optical physics • Optics, Lasers, Photonics, Optical Devices • Physics • Physics and Astronomy • Plasma physics • pulsed electromagnetic hexapole lens • pulsed supersonic beam • scientific equipment, experiments & techniques • Scientific equipment, experiments & techniques • Spectroscopy and Microscopy • Spectrum analysis, spectrochemistry, mass spectrom • Stern-Gerlach deflection • Zeeman and Paschen-Back effects |
| ISBN-10 | 3-319-68429-9 / 3319684299 |
| ISBN-13 | 978-3-319-68429-1 / 9783319684291 |
| Zustand | Neuware |
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