RHEED Transmission Mode and Pole Figures
Thin Film and Nanostructure Texture Analysis
Seiten
2016
|
Softcover reprint of the original 1st ed. 2014
Springer-Verlag New York Inc.
978-1-4939-5366-0 (ISBN)
Springer-Verlag New York Inc.
978-1-4939-5366-0 (ISBN)
This unique book covers the fundamental principle of electron diffraction, basic instrumentation of RHEED, definitions of textures in thin films and nanostructures, mechanisms and control of texture formation, and examples of RHEED transmission mode measurements of texture and texture evolution of thin films and nanostructures.
This unique book covers the fundamental principle of electron diffraction, basic instrumentation of RHEED, definitions of textures in thin films and nanostructures, mechanisms and control of texture formation, and examples of RHEED transmission mode measurements of texture and texture evolution of thin films and nanostructures. Also presented is a new application of RHEED in the transmission mode called RHEED pole figure technique that can be used to monitor the texture evolution in thin film growth and nanostructures and is not limited to single crystal epitaxial film growth. Details of the construction of RHEED pole figures and the interpretation of observed pole figures are presented. Materials covered include metals, semiconductors, and thin insulators.
This book also:
Presents a new application of RHEED in the transmission mode
Introduces a variety of textures from metals, semiconductors, compound semiconductors, and their characteristics in RHEED pole figures
Provides examples of RHEED measurements of texture and texture evolution, construction of RHEED pole figures, and interpretation of observed pole figures
RHEED Transmission Mode and Pole Figures: Thin Film and Nanostructure Texture Analysis is ideal for researchers in materials science and engineering and nanotechnology.
This unique book covers the fundamental principle of electron diffraction, basic instrumentation of RHEED, definitions of textures in thin films and nanostructures, mechanisms and control of texture formation, and examples of RHEED transmission mode measurements of texture and texture evolution of thin films and nanostructures. Also presented is a new application of RHEED in the transmission mode called RHEED pole figure technique that can be used to monitor the texture evolution in thin film growth and nanostructures and is not limited to single crystal epitaxial film growth. Details of the construction of RHEED pole figures and the interpretation of observed pole figures are presented. Materials covered include metals, semiconductors, and thin insulators.
This book also:
Presents a new application of RHEED in the transmission mode
Introduces a variety of textures from metals, semiconductors, compound semiconductors, and their characteristics in RHEED pole figures
Provides examples of RHEED measurements of texture and texture evolution, construction of RHEED pole figures, and interpretation of observed pole figures
RHEED Transmission Mode and Pole Figures: Thin Film and Nanostructure Texture Analysis is ideal for researchers in materials science and engineering and nanotechnology.
Introduction.- Crystal Lattices and Reciprocal Lattices.- Kinematic Scattering of Waves and Diffraction Conditions.- RHEED Reflection Mode.- X-Ray Diffraction.- RHEED Transmission Mode and RHEED Pole Figure.- Instrumentation for RHEED Pole Figure.- Origins of Texture Formation.- Techniques to Control Thin Film Textures.- Applications and Future Direction.- Appendix A: Operational Procedures for RHEED Pole Figure.- Appendix B: RHEED Pattern Simulations.
| Erscheinungsdatum | 11.09.2016 |
|---|---|
| Zusatzinfo | 65 Illustrations, color; 61 Illustrations, black and white; XII, 227 p. 126 illus., 65 illus. in color. |
| Verlagsort | New York |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Themenwelt | Naturwissenschaften ► Chemie ► Physikalische Chemie |
| Technik ► Elektrotechnik / Energietechnik | |
| Technik ► Maschinenbau | |
| Schlagworte | crystal growth • Crystal Lattice • Epitaxial Growth • nanostructures • Reciprocal Lattice • Reflection High Energy Electron Diffraction • RHEED • Scattering of Waves • Thin Films • X-ray diffraction |
| ISBN-10 | 1-4939-5366-4 / 1493953664 |
| ISBN-13 | 978-1-4939-5366-0 / 9781493953660 |
| Zustand | Neuware |
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