Confocal Scanning Optical Microscopy and Related Imaging Systems
Seiten
1996
Academic Press Inc (Verlag)
978-0-12-408750-7 (ISBN)
Academic Press Inc (Verlag)
978-0-12-408750-7 (ISBN)
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Provides an introduction to the field of scanning optical microscopy. This book concentrates on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). It discusses the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology.
This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given.
The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology.A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes.
This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given.
The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology.A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes.
InstrumentsDepth and Transverse ResolutionPhase ImagingApplicationsAppendix A: Vector Field Theory for Depth and Transverse Resolution of a CSOM
| Erscheint lt. Verlag | 18.9.1996 |
|---|---|
| Verlagsort | San Diego |
| Sprache | englisch |
| Maße | 152 x 229 mm |
| Gewicht | 670 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik |
| Naturwissenschaften ► Physik / Astronomie ► Optik | |
| ISBN-10 | 0-12-408750-7 / 0124087507 |
| ISBN-13 | 978-0-12-408750-7 / 9780124087507 |
| Zustand | Neuware |
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