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Applied Crystallography - Proceedings Of The Xvi Conference

Henryk Morawiec, Danuta Stroz (Herausgeber)

Buch | Hardcover
500 Seiten
1995
World Scientific Publishing Co Pte Ltd (Verlag)
978-981-02-2153-9 (ISBN)
CHF 279,30 inkl. MwSt
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This text covers the following areas: phase characterization using diffraction methods; correction factors in powder diffraction; Rietveld method application; X-ray stress analysis; and more.
This volume covers the following areas — phase characterisation using diffraction methods; correction factors in powder diffraction; Rietveld method application; substructure analysis in textured materials; texture inhomogeneity and its determination; new X-ray diffraction methods; small angle scattering studies in crystalline and amorphous solids; X-Ray stress analysis; phase transitions particularly crystallography and pecularities of the reversible martensitic transformation; structure on non-crystalline materials and their crystallisation; structure and properties of new materials.

Crystallography and stability of martensitic phases in Cu-Zn-Al shape memory alloys, M. Ahlers; powder diffraction and epitaxy, J. Fiala; phase transitions in (NH4)3H(SeO4)2, K. Lukaszewicz; modern powder diffraction applied to the study of thermal behaviour of solids - example of cerium (IV) nitrades, D. Louer; a new multilayer optic for parallel-beam applications, H. Goebel; phase characterization using the full diffraction trace, D. Smith; integrated substructure analysis in textured metallic materials; investigation of strongly distorted crystal structures by means of neutron diffraction, P. Klimanek; small-angle X-ray scattering studies of disordered solids, P.W. Schmidt; peculiarities of Martensite transformations and parameter of the SME in Fe-base and B2 type base alloys, Yu Koval; formation of macropores and mesopores in silica sol-gel system, K. Nakanishi; extinction in hexamethylenetetramine, T. Sabine; the bainitic transformation in Cu-Zn-Mn alloys, T. Czeppe; investigation of texture inhomogeneity in near-surface-layers, J. Bonarski. (Part Contents).

Erscheint lt. Verlag 1.5.1995
Verlagsort Singapore
Sprache englisch
Themenwelt Naturwissenschaften Geowissenschaften Mineralogie / Paläontologie
ISBN-10 981-02-2153-3 / 9810221533
ISBN-13 978-981-02-2153-9 / 9789810221539
Zustand Neuware
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