Nicht aus der Schweiz? Besuchen Sie lehmanns.de

Fringe 2009

6th International Workshop on Advanced Optical Metrology
Media-Kombination
XXIV, 792 Seiten
2009 | 2009
Springer Berlin
978-3-642-03050-5 (ISBN)
CHF 519,95 inkl. MwSt
  • Versand in 10-14 Tagen
  • Versandkostenfrei
  • Auch auf Rechnung
  • Artikel merken
This book presents the latest in Optical Metrology in Imaging, Surface Monitoring, Stress Analysis, Quality Control and related fields. Special emphasis is put on modern measurement strategies and new approaches for the extension of existing resolution limits.
The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Optical Metrology in Imaging, Surface Monitoring, Stress Analysis, Non-Destructive Testing, Quality Control, and related fields.
Topics of particular interest are:
New Methods and Tools for the Generation, Acquisition, Processing, and Evaluation of Data in Optical Metrology (Digital Wavefront Engineering)
Application Enhanced Technologies in Optical Metrology (Addressing enhanced Resolution, Reliability and Flexibility)
4D Optical Metrology over a Large Scale Range (from Macro to Nano)
Hybrid Measurement Techniques (Sensor Fusion and the Unification of Modeling, Simulation and Experiment)
New Optical Sensors and Measurement Systems for Industrial Inspection.
Special emphasis is put on modern measurement strategies, taking into account the active combination of physical modelling, computer aided simulation and experimental data acquisition. Special emphasis is directed towards new approaches for the extension of existing resolution limits that open the gates to wide scale metrology, ranging from nano to macro, by using advanced optical sensor systems.

Prof Dr. Wolfgang Osten is head of the Institute of Technical Optics.

Key Note.- Topic 1: New Methods and Tools for Data Acquisition.- Topic 2: Application Enhanced Technologies.- Topic 3: 4D Optical Metrology over a Large Scale.- Topic 4: Hybrid Measurement Techniques.- Topic 5: New Optical Sensors and Measurement.

Erscheint lt. Verlag 11.9.2009
Zusatzinfo XXIV, 792 p. With CD-ROM.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Gewicht 1335 g
Themenwelt Naturwissenschaften Physik / Astronomie
Technik Bauwesen
Technik Maschinenbau
Schlagworte classic interferometry • holographic interferometry, • Messen (Technik) • Messtechnik • Quality Control, Reliability, Safety and Risk • Scanning • Speckle metrology • Structured light techniques • time-of-flight • time-of-flight camera
ISBN-10 3-642-03050-5 / 3642030505
ISBN-13 978-3-642-03050-5 / 9783642030505
Zustand Neuware
Haben Sie eine Frage zum Produkt?
Mehr entdecken
aus dem Bereich